| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2023 | J | jnl |
ATT-TA: A Cooperative Multiagent Deep Reinforcement Learning Approach for TSV Assignment in 3-D ICs.
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2023 | J | jnl |
Microelectron. J.
|
| 2023 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2022 | J | jnl |
An augmented small-signal model of InP HBT with its analytical-based parameter extraction technique.
Microelectron. J.
|
| 2022 | J | jnl |
Microelectron. J.
|
| 2021 | — | conf |
ICTA
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
ASICON
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2018 | J | jnl |
J. Circuits Syst. Comput.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
J. Circuits Syst. Comput.
|
| 2015 | — | conf |
ASICON
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2008 | J | jnl |
Sci. China Ser. F Inf. Sci.
|
| 2008 | J | jnl |
J. Circuits Syst. Comput.
|