| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2026 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | C | conf |
IECON
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2021 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
Active Control Method for Torsional Vibration of DFIG Drive Chain Under Asymmetric Power Grid Fault.
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | C | conf |
IECON
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
Complex.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | C | conf |
IECON
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | C | conf |
IECON
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | C | conf |
IECON
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2017 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | — | conf |
ISIE
|
| 2017 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2016 | C | conf |
IECON
|
| 2016 | C | conf |
Cogging torque reduction in FSPM machines with short magnets and stator lamination bridge structure.
IECON
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|