Yi Zhao

19 papers A* 1Journal 3Unranked 15
YearRankTypeTitle / Venue / Authors
2025 J jnl
CSDet: A Compressed Sensing Object Detection Architecture With Lightweight Networks.
IEEE Trans. Circuits Syst. Video Technol.
Xiaoqian Huang, Yong Gong, Wenhao Wu, Saike Zhu, Yi Zhao
2024 — conf
Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs.
IRPS
Yiming Qu, Chu Yan, Yaru Ding, Yi Zhao
2024 J jnl
Mitigating RC-Delay Induced Accuracy Loss in Analog In-Memory Computing: A Non-Compromising Approach.
IEEE Trans. Consumer Electron.
Saike Zhu, Cimang Lu, Xiang Qiu, Shifan Gao, Xiang Ding, Youngseo Kim, Yi Zhao
2024 — conf
Orthorhombic-I Phase and Related Phase Transitions: Mechanism of Superior Endurance $(> 10^{14})$ of HfZrO Anti-ferroelectrics for DRAM Applications.
IRPS
Zeping Weng, Zhangsheng Lan, Yaru Ding, Yiming Qu, Yi Zhao
2024 — conf
Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs.
IRPS
Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao
2023 — conf
GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model.
IRPS
Xinwei Yu, Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao
2023 — conf
GHz Cycle-to-Cycle Variation in Ultra-scaled FinFETs: From the Time-Zero to the Aging States.
IRPS
Yiming Qu, Chu Yan, Xinwei Yu, Yaru Ding, Yi Zhao
2023 — conf
Interval time dependent wake-up effect of HfZrO ferroelectric capacitor.
IRPS
Yaru Ding, Xinwei Yu, Chu Yan, Zeping Weng, Yiming Qu, Yi Zhao
2022 — conf
Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress.
IRPS
Yaru Ding, Wei Liu, Yiming Qu, Liang Zhao, Yi Zhao
2022 — conf
GHz C-V Characterization Methodology and Its Application for Understanding Polarization Behaviors in High-k Dielectric Films.
IRPS
Yiming Qu, Yang Shen, Mingji Su, Jiwu Lu, Yi Zhao
2022 — conf
Universal Hot Carrier Degradation Model under DC and AC Stresses.
IRPS
Chu Yan, Yaru Ding, Yiming Qu, Liang Zhao, Yi Zhao
2021 A* conf
A Compute-in-Memory Architecture Compatible with 3D NAND Flash that Parallelly Activates Multi-Layers.
DAC
Liang Zhao, Chu Yan, Fan Yang, Shifan Gao, Gabriel Rosca, Dan Manea, Zhichao Lu, Yi Zhao
2021 — conf
Current Research Status and Future Prospect of the In-Memory Computing.
ASICON
Shifan Gao, Fan Yang, Liang Zhao, Yi Zhao
2021 — conf
Nanosecond-scale and self-heating free characterization of advanced CMOS transistors utilizing wave reflection.
IRPS
Wei Liu, Yaru Ding, Liang Zhao, Yi Zhao
2021 — conf
Neural Network Acceleration and Voice Recognition with a Flash-based In-Memory Computing SoC.
AICAS
Liang Zhao, Shifan Gao, Shengbo Zhang, Xiang Qiu, Fan Yang, Jie Li, Zezhi Chen, Yi Zhao
2020 — conf
In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation.
IRPS
Yiming Qu, Jiwu Lu, Junkang Li, Zhuo Chen, Jie Zhang, Chunlong Li, Shiuh-Wuu Lee, Yi Zhao
2019 — conf
Probing Write Error Rate and Random Telegraph Noise of MgO Based Magnetic Tunnel Juction Using a High Throughput Characterization System.
IRPS
Shifan Gao, Bing Chen, Nuo Xu, Yiming Qu, Yi Zhao
2018 — conf
Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs.
IRPS
Yiming Qu, Ran Cheng, Wei Liu, Junkang Li, Bich-Yen Nguyen, Olivier Faynot, Nuo Xu, Bing Chen, Yi Zhao
2018 J jnl
Sub-1 ns characterization methodology for transistor electrical parameter extraction.
Microelectron. Reliab.
Yiming Qu, Bing Chen, Wei Liu, Jinghui Han, Jiwu Lu, Yi Zhao