Yi-Kan Cheng

14 papers A* 3A 2C 2Journal 3Unranked 3
YearRankTypeTitle / Venue / Authors
2012 A conf
Configurable analog routing methodology via technology and design constraint unification.
ICCAD
Po-Cheng Pan, Hung-Ming Chen, Yi-Kan Cheng, Jill Liu, Wei-Yi Hu
2012 A* conf
Efficient trimmed-sample Monte Carlo methodology and yield-aware design flow for analog circuits.
DAC
Chin-Cheng Kuo, Wei-Yi Hu, Yi-Hung Chen, Jui-Feng Kuan, Yi-Kan Cheng
2007 — conf
A New Flexible Algorithm for Random Yield Improvement.
ISQED
Subarna Sinha, Qing Su, Linni Wen, Frank Lee, Charles C. Chiang, Yi-Kan Cheng, Jin-Lien Lin, Yu-Chyi Harn
2000 J jnl
A temperature-aware simulation environment for reliable ULSI chipdesign.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Yi-Kan Cheng, Sung-Mo Kang
2000 C conf
Application-Based, Transistor-Level Full-Chip Power Analysis for 700 MHz PowerPC
ICCD
Yi-Kan Cheng, David Bearden, Kanti Suryadevara
1999 A conf
An efficient method for hot-spot identification in ULSI circuits.
ICCAD
Yi-Kan Cheng, Sung-Mo Kang
1999 — conf
Temperature-driven power and timing analysis for CMOS ULSI circuits.
ISCAS (6)
Yi-Kan Cheng, Sung-Mo Kang
1998 J jnl
ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Yi-Kan Cheng, Prasun Raha, Chin-Chi Teng, Elyse Rosenbaum, Sung-Mo Kang
1997 — —
Electrothermal Simulation and Temperature-Sensitive Reliability Diagnosis for CMOS VLSI Circuits
Yi-Kan Cheng
1997 J jnl
iTEM: a temperature-dependent electromigration reliability diagnosis tool.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
1996 — conf
ETS-A: A New Electrothermal Simulator for CMOS VLSI Circuits.
ED&TC
Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
1996 A* conf
Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects.
DAC
Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
1996 A* conf
iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips.
DAC
Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang
1995 C conf
Chip-Level Thermal Simulator to Predict VLSI Chip Temperature.
ISCAS
Yi-Kan Cheng, Sung-Mo Kang