| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | C | conf |
IAS
|
| 2025 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | — | conf |
ICCE-Taiwan
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2018 | J | jnl |
Sensors
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Sensors
|
| 2016 | — | conf |
APCCAS
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | — | conf |
ISIE
|
| 2014 | C | conf |
IAS
|
| 2014 | — | conf |
ISIE
|
| 2013 | J | jnl |
Sensors
|
| 2012 | J | jnl |
Sensors
|
| 2012 | — | conf |
ISIE
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2011 | C | conf |
IAS
|
| 2009 | J | jnl |
Sensors
|
| 2008 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|