| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
A 0.4 V, 12.2 pW Leakage, 36.5 fJ/Step Switching Efficiency Data Retention Flip-Flop in 22 nm FDSOI.
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2025 | J | jnl |
On-Chip Flow Cytometry Utilizing the Di-Electrophoresis and Ring Oscillator-Based Capacitive Sensor.
IEEE Access
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | — | conf |
NILES
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2024 | — | conf |
NILES
|
| 2024 | — | conf |
ICECET
|
| 2022 | — | conf |
ASP-DAC
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
Medical Biol. Eng. Comput.
|
| 2021 | — | conf |
NILES
|
| 2021 | — | conf |
MLCAD
|
| 2021 | — | conf |
ICECS
|
| 2021 | — | conf |
ICM
|
| 2021 | — | conf |
ICECS
|
| 2020 | J | jnl |
IET Circuits Devices Syst.
|
| 2019 | — | conf |
ICM
|
| 2019 | J | jnl |
Integr.
|
| 2019 | — | conf |
ISSPIT
|
| 2019 | — | conf |
ICM
|
| 2019 | — | conf |
ICM
|
| 2019 | — | conf |
ICM
|
| 2019 | — | conf |
ISSPIT
|
| 2019 | J | jnl |
Microelectron. J.
|
| 2018 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2018 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2018 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2018 | J | jnl |
J. Low Power Electron.
|
| 2018 | — | conf |
ICM
|
| 2018 | J | jnl |
Microelectron. J.
|
| 2018 | C | conf |
ISCAS
|
| 2018 | C | conf |
ISCAS
|
| 2018 | — | conf |
ICM
|
| 2018 | — | conf |
CCWC
|
| 2018 | J | jnl |
Integr.
|
| 2018 | — | conf |
IVSW
|
| 2018 | J | jnl |
J. Circuits Syst. Comput.
|
| 2017 | C | conf |
ISCAS
|
| 2017 | — | conf |
ISQED
|
| 2017 | — | conf |
MWSCAS
|
| 2017 | — | conf |
NGCAS
|
| 2017 | — | conf |
NGCAS
|
| 2017 | — | conf |
AISI
|
| 2017 | — | conf |
ISVLSI
|
| 2017 | — | conf |
ISVLSI
|
| 2017 | — | conf |
MWSCAS
|
| 2017 | J | jnl |
IEEE Commun. Lett.
|
| 2017 | — | conf |
ICM
|
| 2017 | — | conf |
MWSCAS
|
| 2017 | — | conf |
MWSCAS
|
| 2017 | C | conf |
ISCAS
|
| 2017 | — | conf |
ICM
|
| 2017 | C | conf |
ISCAS
|
| 2017 | — | conf |
NGCAS
|
| 2017 | — | conf |
ICM
|
| 2017 | J | jnl |
Integr.
|
| 2017 | C | conf |
ISCAS
|
| 2017 | — | conf |
NGCAS
|
| 2017 | J | jnl |
Int. J. Commun. Syst.
|
| 2017 | — | conf |
ICICDT
|
| 2016 | — | conf |
MWSCAS
|
| 2016 | — | conf |
SoCC
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | — | conf |
ICM
|
| 2016 | — | conf |
MWSCAS
|
| 2016 | — | conf |
ICM
|
| 2016 | — | conf |
ICM
|
| 2016 | — | conf |
ICM
|
| 2016 | C | conf |
ISCAS
|
| 2016 | — | conf |
MWSCAS
|
| 2016 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2016 | J | jnl |
Microelectron. J.
|
| 2016 | C | conf |
ISCAS
|
| 2016 | — | conf |
IDT
|
| 2016 | — | conf |
MWSCAS
|
| 2016 | — | conf |
ICM
|
| 2016 | C | conf |
ISCAS
|
| 2016 | J | jnl |
Microelectron. J.
|
| 2016 | C | conf |
ISCAS
|
| 2015 | — | conf |
ICEAC
|
| 2015 | — | conf |
ICECS
|
| 2015 | — | conf |
ICEAC
|
| 2015 | — | conf |
ICECS
|
| 2015 | — | conf |
ICEAC
|
| 2015 | C | conf |
ISCAS
|
| 2015 | — | conf |
ICECS
|
| 2015 | — | conf |
ICEAC
|
| 2015 | — | conf |
ICEAC
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | — | conf |
ICECS
|
| 2015 | — | conf |
ICECS
|
| 2015 | — | conf |
ICEAC
|
| 2014 | — | conf |
ICM
|
| 2014 | — | conf |
ICM
|
| 2013 | — | conf |
ICECS
|
| 2013 | — | conf |
ICECS
|
| 2013 | — | conf |
ICECS
|
| 2012 | — | conf |
ICEAC
|
| 2012 | — | conf |
ICEAC
|
| 2012 | C | conf |
ISCAS
|
| 2012 | — | conf |
SoCC
|
| 2011 | — | conf |
ICEAC
|
| 2009 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|