| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2026 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | J | jnl |
Appl. Intell.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Int. J. Netw. Manag.
|
| 2025 | J | jnl |
Adv. Eng. Informatics
|
| 2024 | J | jnl |
Inf. Process. Manag.
|
| 2024 | J | jnl |
Sensors
|
| 2024 | J | jnl |
Appl. Intell.
|
| 2024 | J | jnl |
J. Electronic Imaging
|
| 2023 | J | jnl |
Signal Image Video Process.
|
| 2023 | — | conf |
EITCE
|
| 2023 | J | jnl |
Eng. Comput.
|
| 2022 | J | jnl |
Eng. Comput.
|
| 2022 | J | jnl |
Remote. Sens.
|
| 2018 | J | jnl |
Sensors
|
| 2018 | — | conf |
ICIA
|
| 2017 | J | jnl |
IEEE Geosci. Remote. Sens. Lett.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | — | conf |
SSCI
|
| 2016 | — | conf |
IIKI
|