Yasuo Ohno

13 papers Journal 13
YearRankTypeTitle / Venue / Authors
2015 J jnl
Open TG-GATEs: a large-scale toxicogenomics database.
Nucleic Acids Res.
Yoshinobu Igarashi, Noriyuki Nakatsu, Tomoya Yamashita, Atsushi Ono, Yasuo Ohno, Tetsuro Urushidani, Hiroshi Yamada
2013 J jnl
Weighted Lonesum Matrices and Their Generating Function.
Integers
Ken Kamano, Yasuo Ohno, Shuji Yamamoto
2010 J jnl
2D Device Simulation of AlGaN/GaN HFET Current Collapse Caused by Surface Negative Charge Injection.
IEICE Trans. Electron.
Yusuke Ikawa, Yorihide Yuasa, Cheng-Yu Hu, Jin-Ping Ao, Yasuo Ohno
2010 J jnl
Buffer Layer Doping Concentration Measurement Using
IEICE Trans. Electron.
Cheng-Yu Hu, Katsutoshi Nakatani, Hiroji Kawai, Jin-Ping Ao, Yasuo Ohno
2009 J jnl
On exponential polynomials and quantum computing
CoRR
Yasuo Ohno, Yoshitaka Sasaki, Chika Yamazaki
2008 J jnl
A Study on Ohmic Contact to Dry-Etched p-GaN.
IEICE Trans. Electron.
Cheng-Yu Hu, Jin-Ping Ao, Masaya Okada, Yasuo Ohno
2008 J jnl
Investigation on Current Collapse of AlGaN/GaN HFET by Gate Bias Stress.
IEICE Trans. Electron.
Jin-Ping Ao, Yuya Yamaoka, Masaya Okada, Cheng-Yu Hu, Yasuo Ohno
2008 J jnl
Odd perfect numbers have a prime factor exceeding 10
Math. Comput.
Takeshi Goto, Yasuo Ohno
2007 J jnl
On the largest prime divisor of an odd harmonic number.
Math. Comput.
Yusuke Chishiki, Takeshi Goto, Yasuo Ohno
2006 J jnl
A Mechanism of Enhancement-Mode Operation of AlGaN/GaN MIS-HFET.
IEICE Trans. Electron.
Daigo Kikuta, Jin-Ping Ao, Junya Matsuda, Yasuo Ohno
2006 J jnl
Temperature and Illumination Dependence of AlGaN/GaN HFET Threshold Voltage.
IEICE Trans. Electron.
Masaya Okada, Ryohei Takaki, Daigo Kikuta, Jin-Ping Ao, Yasuo Ohno
2005 J jnl
Evaluation of Surface States of AlGaN/GaN HFET Using Open-Gated Structure.
IEICE Trans. Electron.
Daigo Kikuta, Jin-Ping Ao, Yasuo Ohno
1996 J jnl
A high-speed low-power tri-state driver flip flop for ultra-low supply voltage GaAs heterojunction FET LSI's.
IEEE J. Solid State Circuits
Tadashi Maeda, Keiichi Numata, Masatoshi Tokushima, Masaoki Ishikawa, Muneo Fukaishi, Hikam Hida, Yasuo Ohno