Yasuo Nakagawa

13 papers A* 2A 1Misc 3Journal 6Unranked 1
YearRankTypeTitle / Venue / Authors
2009 J jnl
Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor Manufacturing.
IEICE Trans. Electron.
Yuichi Hamamura, Chizu Matsumoto, Yoshiyuki Tsunoda, Koji Kamoda, Yoshio Iwata, Kenji Kanamitsu, Daisuke Fujiki, Fujihiko Kojika, Hiromi Fujita, Yasuo Nakagawa, Shun'ichi Kaneko
1994 A conf
Precise visual inspection for LSI wafer patterns using subpixel image alignment.
WACV
Takashi Hiroi, Shunji Maeda, Hitoshi Kubota, Kenji Watanabe, Yasuo Nakagawa
1994 J jnl
Shape from Focus.
IEEE Trans. Pattern Anal. Mach. Intell.
Shree K. Nayar, Yasuo Nakagawa
1992 — conf
Automatic screen-printed circuit pattern inspection using connectivity preserving image reduction and connectivity comparison.
ICPR (1)
Takanori Ninomiya, Kazushi Yoshimura, Mineo Nomoto, Yasuo Nakagawa
1992 Misc conf
Development of Solder Joint Inspection Method Using Air Stimulation Speckle Vibration Detection Method and Fluorescence Detection Method.
MVA
Takashi Hiroi, Kazushi Yoshimura, Takanori Ninomiya, Toshimitsu Hamada, Yasuo Nakagawa, Shigeki Mio, Kouichi Karasaki, Hideaki Sasaki
1990 J jnl
Automated visual inspection for lsi water multilayer patterns by cascade pattern matching algorithm.
Syst. Comput. Jpn.
Shunji Maeda, Hitoshi Kubota, Hiroshi Makihira, Takanori Ninomiya, Yasuo Nakagawa, Yuzo Taniguchi
1990 Misc conf
Precise Position Detection of a Mesh-Backed Printing Screen Based on the Smallest Enclosing Circle Detection.
MVA
Takanori Ninomiya, Yasuo Nakagawa
1990 J jnl
Precise Visual Inspection of LSI Wafer Patterns by Local Perturbation Pattern Matching Algorithm.
Syst. Comput. Jpn.
Yukio Matsuyama, Hisafumi Iwata, Hitoshi Kubota, Yasuo Nakagawa
1990 A* conf
Shape from focus: an effective approach for rough surfaces.
ICRA
Shree K. Nayar, Yasuo Nakagawa
1989 A* conf
Automatic 2 1/2 D shape inspection system for via-hole fillings of green sheets by shadow image analysis.
ICRA
Takanori Ninomiya, Mineo Nomoto, Yasuo Nakagawa
1988 Misc conf
Precise Visual Inspection Algorithm for LSI Wafer Patterns Using Grayscale Image Comparison.
MVA
Yukio Matsuyama, Hisafumi Iwata, Hitoshi Kubota, Yasuo Nakagawa
1979 J jnl
A note on polygonal and elliptical approximation of mechanical parts.
Pattern Recognit.
Yasuo Nakagawa, Azriel Rosenfeld
1979 J jnl
Some experiments on variable thresholding.
Pattern Recognit.
Yasuo Nakagawa, Azriel Rosenfeld