Yashwant K. Malaiya

99 papers A* 6A 27B 4C 5Misc 13Journal 29Unranked 15

Year	Rank	Type	Title / Venue / Authors
2023	Misc	`conf`	Comparison of Agile Scaling Frameworks. ICISS Robin J. Yeman, Yashwant K. Malaiya
2021	J	`jnl`	Social media analytics of the Internet of Things. Discov. Internet Things Jim A. Scheibmeir, Yashwant K. Malaiya
2020	J	`jnl`	Adaptive Testing Based on Moment Estimation. IEEE Trans. Syst. Man Cybern. Syst. Peng Xiao, Yongfeng Yin, Bin Liu, Bo Jiang, Yashwant K. Malaiya
2019	—	`conf`	An API Development Model for Digital Twins. QRS Companion Jim A. Scheibmeir, Yashwant K. Malaiya
2019	—	`conf`	Quality Model for Testing Augmented Reality Applications. UEMCON Jim A. Scheibmeir, Yashwant K. Malaiya
2017	J	`jnl`	Periodicity in software vulnerability discovery, patching and exploitation. Int. J. Inf. Sec. Hyunchul Joh, Yashwant K. Malaiya
2016	J	`jnl`	Assessing vulnerability exploitability risk using software properties. Softw. Qual. J. Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray
2016	Misc	`conf`	Evaluating CVSS Base Score Using Vulnerability Rewards Programs. SEC Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray
2016	—	`conf`	To Fear or Not to Fear That is the Question: Code Characteristics of a Vulnerable Functionwith an Existing Exploit. CODASPY Awad A. Younis, Yashwant K. Malaiya, Charles Anderson, Indrajit Ray
2015	C	`conf`	Comparing and Evaluating CVSS Base Metrics and Microsoft Rating System. QRS Awad A. Younis, Yashwant K. Malaiya
2014	—	`conf`	Are the Classical Disaster Recovery Tiers Still Applicable Today? ISSRE Workshops Omar Hussain Alhazmi, Yashwant K. Malaiya
2014	J	`jnl`	Modeling Skewness in Vulnerability Discovery. Qual. Reliab. Eng. Int. Hyunchul Joh, Yashwant K. Malaiya
2014	—	`conf`	Using Attack Surface Entry Points and Reachability Analysis to Assess the Risk of Software Vulnerability Exploitability. HASE Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray
2014	—	`conf`	Using Software Structure to Predict Vulnerability Exploitation Potential. SERE (Companion) Awad A. Younis, Yashwant K. Malaiya
2012	—	`conf`	Assessing Disaster Recovery Alternatives: On-Site, Colocation or Cloud. ISSRE Workshops Omar Hussain Alhazmi, Yashwant K. Malaiya
2011	J	`jnl`	Modeling vulnerability discovery process in Apache and IIS HTTP servers. Comput. Secur. Sung-Whan Woo, Hyunchul Joh, Omar Hussain Alhazmi, Yashwant K. Malaiya
2010	A	`conf`	Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. ITC Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird
2009	A	`conf`	An outlier detection based approach for PCB testing. ITC Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird
2009	A	`conf`	Seasonal Variation in the Vulnerability Discovery Process. ICST Hyunchul Joh, Yashwant K. Malaiya
2008	J	`jnl`	Antirandom Testing: A Distance-Based Approach. VLSI Design Shen Hui Wu, Sridhar Jandhyala, Yashwant K. Malaiya, Anura P. Jayasumana
2008	J	`jnl`	Application of Vulnerability Discovery Models to Major Operating Systems. IEEE Trans. Reliab. Omar Hussain Alhazmi, Yashwant K. Malaiya
2008	A	`conf`	Seasonality in Vulnerability Discovery in Major Software Systems. ISSRE Hyunchul Joh, Yashwant K. Malaiya
2008	A	`conf`	Vulnerability Discovery Modeling Using Weibull Distribution. ISSRE Hyunchul Joh, Jinyoo Kim, Yashwant K. Malaiya
2007	J	`jnl`	Measuring, analyzing and predicting security vulnerabilities in software systems. Comput. Secur. Omar Hussain Alhazmi, Yashwant K. Malaiya, Indrajit Ray
2007	—	`conf`	Vulnerability Discovery in Multi-Version Software Systems. HASE Jinyoo Kim, Yashwant K. Malaiya, Indrakshi Ray
2006	C	`conf`	Assessing Vulnerabilities in Apache and IIS HTTP Servers. DASC Sung-Whan Woo, Omar Hussain Alhazmi, Yashwant K. Malaiya
2006	A	`conf`	Measuring and Enhancing Prediction Capabilities of Vulnerability Discovery Models for Apache and IIS HTTP Servers. ISSRE Omar Hussain Alhazmi, Yashwant K. Malaiya
2006	—	`conf`	Security vulnerability categories in major software systems. Communication, Network, and Information Security Omar Hussain Alhazmi, Sung-Whan Woo, Yashwant K. Malaiya
2006	Misc	`conf`	X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. VTS Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya
2005	B	`conf`	Dynamic power minimization during combinational circuit testing as a traveling salesman problem. Congress on Evolutionary Computation Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley, Yashwant K. Malaiya
2005	A	`conf`	Modeling the Vulnerability Discovery Process. ISSRE Omar Hussain Alhazmi, Yashwant K. Malaiya
2005	B	`conf`	Security Vulnerabilities in Software Systems: A Quantitative Perspective. DBSec Omar Hussain Alhazmi, Yashwant K. Malaiya, Indrajit Ray
2004	—	`conf`	Augmenting Test Case Generation Using Statechart. Software Engineering Research and Practice Jiao Chen, Yashwant K. Malaiya
2002	J	`jnl`	Software reliability growth with test coverage. IEEE Trans. Reliab. Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich
2000	A	`conf`	Module Size Distribution and Defect Density. ISSRE Yashwant K. Malaiya, Jason Denton
1999	A	`conf`	Requirements volatility and defect density. ISSRE Yashwant K. Malaiya, Jason Denton
1998	C	`conf`	Antirandom vs. pseudorandom testing. ICCD Shen Hui Wu, Yashwant K. Malaiya, Anura P. Jayasumana
1998	—	`conf`	Estimating the Number of Residual Defects. HASE Yashwant K. Malaiya, Jason Denton
1997	A	`conf`	Automatic test generation using checkpoint encoding and antirandom testing. ISSRE Huifang Yin, Zemen Lebne-Dengel, Yashwant K. Malaiya
1997	Misc	`conf`	Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I VLSI Design Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana
1997	J	`jnl`	Operational and Test Performance in the Presence of Built-in Current Sensors. VLSI Design Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong
1997	A	`conf`	What do the software reliability growth model parameters represent? ISSRE Yashwant K. Malaiya, Jason Denton
1996	J	`jnl`	Fault Modeling of ECL for High Fault Coverage of Physical Defects. VLSI Design Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana
1996	A	`conf`	Fault exposure ratio estimation and applications. ISSRE Michael Naixin Li, Yashwant K. Malaiya
1996	—	`conf`	Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits. Great Lakes Symposium on VLSI Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
1995	C	`conf`	A Novel High-Speed BiCMOS Domino Logic Family. ISCAS Anura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon
1995	A	`conf`	Antirandom testing: getting the most out of black-box testing. ISSRE Yashwant K. Malaiya
1995	B	`conf`	Interconnection of FDDI-II networks through an ATM backbone - An analysis. LCN Ramanagopal V. Vogety, Yashwant K. Malaiya, Anura P. Jayasumana
1995	A	`conf`	ROBUST: a next generation software reliability engineering tool. ISSRE Michael Naixin Li, Yashwant K. Malaiya
1995	J	`jnl`	Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. IEEE J. Solid State Circuits Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Rochit Rajsuman
1994	Misc	`conf`	Input pattern classification for transistor level testing of BiCMOS circuits. VTS Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
1994	A	`conf`	On input profile selection for software testing. ISSRE Michael Naixin Li, Yashwant K. Malaiya
1994	J	`jnl`	Resolution Enhancement in I VLSI Design Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong, Sankaran M. Menon
1994	Misc	`conf`	The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance. VLSI Design Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong
1994	A	`conf`	The relationship between test coverage and reliability. ISSRE Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich, Bob Skibbe
1993	J	`jnl`	An Examination of Fault Exposure Ratio. IEEE Trans. Software Eng. Yashwant K. Malaiya, Anneliese von Mayrhauser, Pradip K. Srimani
1993	A	`conf`	Enhancing accuracy of software reliability prediction. ISSRE Michael Naixin Li, Yashwant K. Malaiya
1993	J	`jnl`	Faulty behavior of storage elements and its effects on sequential circuits. IEEE Trans. Very Large Scale Integr. Syst. W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana
1993	A	`conf`	On the need for simulation for better characterization of software reliability. ISSRE Anneliese von Mayrhauser, Yashwant K. Malaiya, Pradip K. Srimani, James Keables
1993	C	`conf`	Test Generation for BiCMOS Circuits. ISCAS Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
1993	Misc	`conf`	Testable design for BiCMOS stuck-open fault detection. VTS Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
1993	A	`conf`	The effect of correlated faults on software reliability. ISSRE Kang Wu, Yashwant K. Malaiya
1993	Misc	`conf`	Use of Storage Elements as Primitives for Modelling Faults in Synchronous Sequential Circuits. VLSI Design W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana
1992	Misc	`conf`	Behavior of faulty single BJT BiCMOS logic gates. VTS Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana
1992	J	`jnl`	Guest Editor's Introduction: VLSI Design 92. IEEE Des. Test Comput. Yashwant K. Malaiya
1992	Misc	`conf`	On Bridging Faults in ECL Circuits. VLSI Design Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
1992	J	`jnl`	Prediction of Software Reliability Using Connectionist Models. IEEE Trans. Software Eng. Nachimuthu Karunanithi, L. Darrell Whitley, Yashwant K. Malaiya
1992	J	`jnl`	Steps to Practical Reliability Meassurement - Guest Editors' Introduction. IEEE Softw. Pradip K. Srimani, Yashwant K. Malaiya
1992	A	`conf`	The nature of fault exposure ratio. ISSRE Yashwant K. Malaiya, Anneliese von Mayrhauser, Pradip K. Srimani
1992	A	`conf`	The scaling problem in neural networks for software reliability prediction. ISSRE Nachimuthu Karunanithi, Yashwant K. Malaiya
1992	J	`jnl`	Using Neural Networks in Reliability Prediction. IEEE Softw. Nachimuthu Karunanithi, L. Darrell Whitley, Yashwant K. Malaiya
1991	—	`conf`	An Introduction to Software Reliability Models. Int. CMG Conference Yashwant K. Malaiya, Pradip K. Srimani
1991	Misc	`conf`	An analysis and testing of operation induced faults in MOS VLSI. VTS Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya, Juney Park
1991	J	`jnl`	Analysis of Detection Capability of Parallel Signature Analyzers. IEEE Trans. Computers Yinghua Min, Yashwant K. Malaiya, Boping Jin
1991	J	`jnl`	Design of CMOS circuits for stuck-open fault testability. IEEE J. Solid State Circuits Anura P. Jayasumana, Yashwant K. Malaiya, Rochit Rajsuman
1991	Misc	`conf`	Enhancement of resolution in supply current based testing for large ICs. VTS Yashwant K. Malaiya, Anura P. Jayasumana, Qiao Tong, Sankaran M. Menon
1991	Misc	`conf`	Evaluation of detectability in BIST environment. VTS Sheng Feng, Yashwant K. Malaiya
1991	—	`conf`	Gate level representation of ECL circuits for fault modeling. Great Lakes Symposium on VLSI Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
1991	A	`conf`	Prediction of software reliability using neural networks. ISSRE Nachimuthu Karunanithi, Yashwant K. Malaiya, L. Darrell Whitley
1991	A*	`ed.`	Proceedings of the 24th Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 24, Albuquerque, New Mexico, USA, November 18-20, 1991 MICRO Yashwant K. Malaiya
1990	A*	`conf`	On the testing of microprogrammed processor. MICRO Suntae Hwang, Rochit Rajsuman, Yashwant K. Malaiya
1990	B	`conf`	Predictability measures for software reliability models. COMPSAC Yashwant K. Malaiya, Nachimuthu Karunanithi, Pradeep Verma
1989	A*	`conf`	CMOS Stuck-open Fault Detection Using Single Test Patterns. DAC Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya
1989	J	`jnl`	CMOS open-fault detection in the presence of glitches and timing skews. IEEE J. Solid State Circuits Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya
1989	J	`jnl`	CMOS stuck-open fault testability. IEEE J. Solid State Circuits Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana
1989	J	`jnl`	Limitations of switch level analysis for bridging faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana
1989	A*	`conf`	On inherent untestability of unaugmented microprogrammed control. MICRO Yashwant K. Malaiya
1988	A*	`conf`	Design of a testable RISC-to-CISC control architecture. MICRO Yashwant K. Malaiya, Sheng Feng
1987	A*	`conf`	On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates. DAC Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana
1985	A	`conf`	Faults in Microprogrammed and Hardwired Control. ITC Yashwant K. Malaiya
1984	J	`jnl`	Modeling and Testing for Timing Faults in Synchronous Sequential Circuits. IEEE Des. Test Yashwant K. Malaiya, Ramesh Narayanaswamy
1984	A	`conf`	The Coverage Problem for Random Testing. ITC Yashwant K. Malaiya, Shoubao Yang
1983	A	`conf`	Testing for Timing Faults in Synchronous Sequential Integrated Circuits. ITC Yashwant K. Malaiya, Ramesh Narayanaswamy
1982	A	`conf`	A New Fault Model and Testing Technique for CMOS Devices. ITC Yashwant K. Malaiya, Stephen Y. H. Su
1981	J	`jnl`	Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults. IEEE Trans. Computers Yashwant K. Malaiya, Stephen Y. H. Su
1981	A	`conf`	State Diagram Approach for Functional Testing of Control Section. ITC Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya
1981	J	`jnl`	Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits. IEEE Trans. Computers Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya
1979	—	`conf`	A survey of methods for intermittent fault analysis. MARK Yashwant K. Malaiya, Stephen Y. H. Su
1978	J	`jnl`	A Continous-Parameter Markov Model and Detection Procedures for Intermittent Faults. IEEE Trans. Computers Stephen Y. H. Su, Israel Koren, Yashwant K. Malaiya