Yaqing Chi

21 papers C 1Journal 14Unranked 6
YearRankTypeTitle / Venue / Authors
2026 J jnl
A Compact Low-Jitter All-Digital Fractional Output Divider Using Split-DTC-Based Background Calibration.
IEEE J. Solid State Circuits
Deng Luo, Yan Yu, Jianjun Chen, Yang Guo, Yaqing Chi, Guofang Yu, Hao Ding, Jing Xiao, Hao Gao, Ming Tao, Kai Tang, Bin Liang
2026 J jnl
An Area-Efficient Fractional Output Divider Based on Foreground DTC INL Calibration.
IEEE Trans. Circuits Syst. II Express Briefs
Yan Yu, Deng Luo, Ming Tao, Jianjun Chen, Yaqing Chi, Guofang Yu, Jingtian Liu, Bin Liang
2025 — conf
A 0.024mm
ISSCC
Yan Yu, Deng Luo, Jianjun Chen, Yang Guo, Bin Liang, Yaqing Chi, Hanhan Sun, Jing Xiao, Hao Gao, Ming Tao, Kai Tang
2025 J jnl
Analysis of false lock in Mueller-Muller clock and data recovery system.
Integr.
Yahao Fang, Deng Luo, Bin Liang, Jianjun Chen, Yaqing Chi, Hanhan Sun, Qian Sun, Jingtian Liu
2022 C conf
Implementation of Radiation Hardened Flip-Flops Based on Novel Fishbone Layouts.
ISCAS
Chang Cai, Zehao Wu, Jing Zhang, Luchang Ding, Lei Shen, Jun Yu, Yaqing Chi
2021 J jnl
Current mirror with charge dissipation transistor for analogue single-event transient mitigation in space application.
IET Circuits Devices Syst.
Jingtian Liu, Bin Liang, Jianjun Chen, Yaqing Chi, Li Yan, Yang Guo
2020 J jnl
Investigation of Heavy-Ion Induced Single-Event Transient in 28 nm Bulk Inverter Chain.
Symmetry
Anquan Wu, Bin Liang, Yaqing Chi, Zhenyu Wu
2020 J jnl
MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology.
IEICE Electron. Express
Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen
2020 J jnl
Research on the influences of well structure on dose rate effects in 65nm CMOS circuit.
IEICE Electron. Express
Qian Chen, Jianwei Han, Yingqi Ma, Sai Li, Jingtian Liu, Yaqing Chi, Bin Liang
2019 J jnl
28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery.
IEEE Access
Hengzhou Yuan, Yang Guo, Jianjun Chen, Yaqing Chi, Xi Chen, Bin Liang
2019 — conf
A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area.
ASICON
Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen
2019 J jnl
Characterization of P-hit and N-hit single-event transient using heavy ion microbeam.
IEICE Electron. Express
Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen
2019 J jnl
Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs.
Symmetry
Jingyan Xu, Yang Guo, Ruiqiang Song, Bin Liang, Yaqing Chi
2017 — conf
A Programmable Pre-emphasis Transmitter for SerDes in 40 nm CMOS.
NCCET
Hongbing Tan, Haiyan Chen, Sheng Liu, Xikun Ma, Yaqing Chi
2017 J jnl
Comparison of single-event upset generated by heavy ion and pulsed laser.
Sci. China Inf. Sci.
Bin Liang, Ruiqiang Song, Jianwei Han, Yaqing Chi, Rui Chen, Chunmei Hu, Jianjun Chen, Yingqi Ma, Shipeng Shangguan
2017 J jnl
Modeling the impact of process and operation variations on the soft error rate of digital circuits.
Sci. China Inf. Sci.
Ruiqiang Song, Shuming Chen, Bin Liang, Yaqing Chi, Jianjun Chen
2014 — conf
A low contact resistance graphene field effect transistor with single-layer-channel and multi-layer-contact.
NANOARCH
Honghui Sun, Liang Fang, Yao Wang, Yaqing Chi, Rulin Liu
2014 J jnl
Research on single-event transient mechanism in a novel SOI CMOS technology.
IEICE Electron. Express
Chao Zhang, Jianjun Chen, Yaqing Chi, Hui Yang
2013 — conf
A Scan Chain Based SEU Test Method for Microprocessors.
NCCET
Yaqing Chi, Yibai He, Bin Liang, Chunmei Hu
2010 J jnl
Analysis of negative differential conductance of single-island single-electron transistors owing to Coulomb oscillations.
IET Circuits Devices Syst.
Bingcai Sui, Liang Fang, Yaqing Chi, Chao Zhang
2010 — conf
Reconfigurable logic gate implemented by suspended-gate single-electron transistors.
NEMS
Bingcai Sui, Liang Fang, Yaqing Chi