| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Int. J. Intell. Syst.
|
| 2025 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2023 | — | conf |
ISSSR
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
J. Frankl. Inst.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
J. Syst. Control. Eng.
|
| 2018 | J | jnl |
Sensors
|
| 2017 | — | conf |
CIS/RAM
|
| 2017 | — | conf |
CIS/RAM
|
| 2015 | — | conf |
AIM
|
| 2013 | — | conf |
AIM
|
| 2012 | C | conf |
INDIN
|
| 2012 | C | conf |
INDIN
|
| 2009 | J | jnl |
Int. J. Comput. Appl. Technol.
|
| 2008 | — | conf |
RAM
|
| 2008 | — | conf |
RAM
|
| 2008 | — | conf |
RAM
|