| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Displays
|
| 2026 | J | jnl |
Adv. Eng. Informatics
|
| 2026 | J | jnl |
Pattern Recognit.
|
| 2025 | J | jnl |
J. Electronic Imaging
|
| 2025 | J | jnl |
IEEE Trans. Neural Networks Learn. Syst.
|
| 2025 | J | jnl |
Pattern Recognit. Lett.
|
| 2025 | J | jnl |
J. Intell. Manuf.
|
| 2025 | J | jnl |
Pattern Recognit. Lett.
|
| 2025 | J | jnl |
Knowl. Based Syst.
|
| 2025 | J | jnl |
Pattern Recognit. Lett.
|
| 2025 | J | jnl |
LGGFormer: A dual-branch local-guided global self-attention network for surface defect segmentation.
Adv. Eng. Informatics
|
| 2025 | J | jnl |
MGDefect: A Mask-Guided High-Quality Defect Image Generation Method for Improving Defect Inspection.
IEEE Trans. Multim.
|
| 2025 | J | jnl |
Displays
|
| 2025 | J | jnl |
Digit. Signal Process.
|
| 2025 | J | jnl |
IEEE Trans. Emerg. Top. Comput. Intell.
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2025 | A* | conf |
CVPR
|
| 2024 | — | conf |
PRCV (9)
|
| 2024 | J | jnl |
J. Electronic Imaging
|
| 2024 | — | conf |
ICPR (10)
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | — | conf |
PRCV (3)
|
| 2024 | J | jnl |
Appl. Intell.
|
| 2024 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2019 | J | jnl |
Algorithms
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
J. Electronic Imaging
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
J. Electronic Imaging
|
| 2017 | — | conf |
GlobalSIP
|