| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Knowl. Based Syst.
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2026 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2026 | J | jnl |
Comput. Sci. Rev.
|
| 2026 | J | jnl |
IEEE Internet Things J.
|
| 2026 | J | jnl |
Ad Hoc Networks
|
| 2026 | J | jnl |
Comput. Networks
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
Complex Intell. Syst.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Comput. Ind. Eng.
|
| 2025 | J | jnl |
NeuroImage
|
| 2025 | J | jnl |
Digit. Signal Process.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Computational Imaging
|
| 2025 | — | conf |
NAACL (Long Papers)
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Knowl. Based Syst.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
IEEE Trans. Image Process.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Displays
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
Adv. Eng. Softw.
|
| 2025 | J | jnl |
Kybernetes
|
| 2025 | Misc | conf |
Towards Patronizing and Condescending Language in Chinese Videos: A Multimodal Dataset and Detector.
ICASSP
|
| 2024 | J | jnl |
Comput. Networks
|
| 2024 | J | jnl |
Signal Process.
|
| 2024 | J | jnl |
Knowl. Based Syst.
|
| 2024 | J | jnl |
Sensors
|
| 2024 | J | jnl |
Sensors
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
Inf.
|
| 2024 | — | conf |
BIBM
|
| 2024 | — | conf |
PRICAI (2)
|
| 2024 | J | jnl |
Sensors
|
| 2024 | J | jnl |
Symmetry
|
| 2024 | J | jnl |
Towards Patronizing and Condescending Language in Chinese Videos: A Multimodal Dataset and Detector.
CoRR
|
| 2024 | J | jnl |
Artif. Intell. Medicine
|
| 2023 | J | jnl |
IEICE Electron. Express
|
| 2023 | J | jnl |
Biomed. Signal Process. Control.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | — | conf |
HPCC/DSS/SmartCity/DependSys
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
IEICE Trans. Electron.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Intell. Veh.
|
| 2023 | J | jnl |
IEEE Internet Things J.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Sensors
|
| 2023 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
Algorithms
|
| 2022 | J | jnl |
Semisupervised Momentum Prototype Network for Gearbox Fault Diagnosis Under Limited Labeled Samples.
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
Inf.
|
| 2022 | A | conf |
WACV
|
| 2021 | J | jnl |
IEICE Electron. Express
|
| 2021 | J | jnl |
Biomed. Signal Process. Control.
|
| 2021 | J | jnl |
Image Vis. Comput.
|
| 2021 | J | jnl |
J. Glob. Inf. Manag.
|
| 2021 | J | jnl |
IEEE Trans. Computational Imaging
|
| 2021 | J | jnl |
IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
IET Circuits Devices Syst.
|
| 2020 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
Generation of two-mode squeezing of mechanical oscillators in the multi-mode optomechanical systems.
Quantum Inf. Process.
|
| 2020 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2020 | A | conf |
WACV
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
Symmetry
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
计算机科学
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
Comput. Ind.
|
| 2019 | — | conf |
ICCAIS
|
| 2019 | J | jnl |
IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
I2MTC
|
| 2019 | — | conf |
FARM@ICFP
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
APCCAS
|
| 2018 | — | conf |
ICC Workshops
|
| 2018 | J | jnl |
Neural Comput.
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Commun. Mag.
|
| 2018 | C | conf |
APCC
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | — | conf |
ICIMCS
|
| 2018 | — | conf |
ICGEC
|
| 2018 | B | conf |
WCNC
|
| 2018 | — | conf |
ICIEB
|
| 2018 | J | jnl |
Sensors
|
| 2018 | B | conf |
WCNC
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
Sci. China Inf. Sci.
|
| 2017 | J | jnl |
Sensors
|
| 2017 | A | conf |
DATE
|
| 2017 | — | conf |
ISOCC
|
| 2017 | J | jnl |
Int. J. Biomed. Imaging
|
| 2017 | J | jnl |
Sci. China Inf. Sci.
|
| 2017 | — | conf |
MWSCAS
|
| 2016 | J | jnl |
Sensors
|
| 2016 | J | jnl |
Sensors
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2015 | J | jnl |
Microelectron. J.
|
| 2015 | J | jnl |
IEICE Electron. Express
|
| 2015 | J | jnl |
IEICE Electron. Express
|
| 2015 | J | jnl |
Libr. Hi Tech
|
| 2015 | J | jnl |
Libr. Hi Tech
|
| 2015 | — | conf |
ICC
|
| 2015 | — | conf |
EIT
|
| 2015 | — | conf |
EIT
|
| 2014 | J | jnl |
Sci. China Inf. Sci.
|
| 2014 | J | jnl |
Sensors
|
| 2014 | J | jnl |
IEICE Electron. Express
|
| 2014 | J | jnl |
Sci. China Inf. Sci.
|
| 2014 | J | jnl |
IEICE Electron. Express
|
| 2014 | J | jnl |
IEICE Electron. Express
|
| 2014 | J | jnl |
Microelectron. J.
|
| 2014 | J | jnl |
IEICE Electron. Express
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | C | conf |
ICIS
|
| 2014 | — | conf |
EIT
|
| 2014 | J | jnl |
Sensors
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
IEEE J. Solid State Circuits
|
| 2013 | — | conf |
EMBC
|
| 2013 | J | jnl |
IEICE Electron. Express
|
| 2013 | J | jnl |
J. Circuits Syst. Comput.
|
| 2013 | J | jnl |
OCLC Syst. Serv.
|
| 2013 | J | jnl |
Microelectron. J.
|
| 2013 | J | jnl |
J. Circuits Syst. Comput.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | — | conf |
AICI
|
| 2012 | — | conf |
ISIE
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
IET Circuits Devices Syst.
|
| 2011 | — | conf |
AICI (2)
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
J. Knowl. Manag.
|
| 2011 | J | jnl |
Int. J. Inf. Technol. Decis. Mak.
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2010 | J | jnl |
Design of a high-speed sample-and-hold circuit using a substrate-biasing-effect attenuated T switch.
Microelectron. J.
|
| 2010 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2010 | J | jnl |
OCLC Syst. Serv.
|
| 2009 | — | conf |
CSIE (1)
|
| 2008 | J | jnl |
Microelectron. Reliab.
|
| 2008 | — | conf |
iPRES
|
| 2007 | — | conf |
ICIC (2)
|
| 2007 | — | conf |
ISICA
|
| 2007 | A | conf |
INTERSPEECH
|
| 2007 | J | jnl |
IEEE Trans. Speech Audio Process.
|
| 2006 | J | jnl |
Libr. Hi Tech
|
| 2006 | — | conf |
ISCSLP
|
| 2006 | A | conf |
INTERSPEECH
|
| 2006 | — | conf |
ICASSP (1)
|
| 2006 | J | jnl |
Int. J. Biomed. Imaging
|
| 2005 | J | jnl |
Electron. Libr.
|
| 2005 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2005 | C | conf |
PDCAT
|
| 2005 | A | conf |
INTERSPEECH
|
| 2005 | — | conf |
EUSIPCO
|
| 2003 | C | conf |
SACMAT
|