Xuerong Ye

23 papers Journal 22Unranked 1
YearRankTypeTitle / Venue / Authors
2026 J jnl
Dynamic human reliability and dual-type quality prediction in human-machine collaborative tuning manufacturing systems.
Reliab. Eng. Syst. Saf.
Jun Tan, Fabin Mei, Xuerong Ye, Guofu Zhai
2025 J jnl
Cumulative Degradation Modeling of Electrolytic Capacitors Considering Stress Interactions in Industrial Applications.
IEEE Trans. Ind. Electron.
Qisen Sun, Cen Chen, Zicheng Wang, Xuerong Ye, Min Xie, Guofu Zhai
2023 J jnl
Life prediction of lithium thionyl chloride batteries based on the pulse load test and accelerated degradation test.
Qual. Reliab. Eng. Int.
Xuerong Ye, Qisen Sun, Wenwen Li, Guofu Zhai
2023 J jnl
Model-based quality consistency analysis of permanent magnet synchronous motor cogging torque in wide temperature range.
Qual. Reliab. Eng. Int.
Cen Chen, Chengzhi Sun, Liqin Wu, Xuerong Ye, Guofu Zhai
2023 J jnl
Reliability Analysis Based on a Bivariate Degradation Model Considering Random Initial State and Its Correlation With Degradation Rate.
IEEE Trans. Reliab.
Bokai Zheng, Cen Chen, Yigang Lin, Xuerong Ye, Guofu Zhai
2022 J jnl
A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling.
Reliab. Eng. Syst. Saf.
Xuerong Ye, Yifan Hu, Bokai Zheng, Cen Chen, Guofu Zhai
2022 J jnl
Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process.
Reliab. Eng. Syst. Saf.
Bokai Zheng, Cen Chen, Yigang Lin, Yifan Hu, Xuerong Ye, Guofu Zhai, Enrico Zio
2021 J jnl
A failure mechanism consistency test method for accelerated degradation test.
Qual. Reliab. Eng. Int.
Guofu Zhai, Bokai Zheng, Xuerong Ye, Shuang Si, Enrico Zio
2021 J jnl
An Adaptive Optimized TVF-EMD Based on a Sparsity-Impact Measure Index for Bearing Incipient Fault Diagnosis.
IEEE Trans. Instrum. Meas.
Xuerong Ye, Yifan Hu, Junxian Shen, Cen Chen, Guofu Zhai
2021 — conf
An Excitation Method for Fault Diagnosis of DC-AC Converter Based on Simulation.
I2MTC
Yun Yang, Cen Chen, Xuerong Ye, Chengzhi Sun
2021 J jnl
Life-Cycle Dynamic Robust Design Optimization for Batch Production of Permanent Magnet Actuator.
IEEE Trans. Ind. Electron.
Xuerong Ye, Hao Chen, Cen Chen, Guofu Zhai
2021 J jnl
Soft Fault Diagnosis Using URV-LDA Transformed Feature Dictionary.
IEEE Access
Cen Chen, Yun Yang, Xuerong Ye, Guofu Zhai
2020 J jnl
An Improved Empirical Mode Decomposition Based on Adaptive Weighted Rational Quartic Spline for Rolling Bearing Fault Diagnosis.
IEEE Access
Xuerong Ye, Yifan Hu, Junxian Shen, Rui Feng, Guofu Zhai
2018 J jnl
A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests.
IEEE Access
Xuerong Ye, Cen Chen, Myeongsu Kang, Guofu Zhai, Michael G. Pecht
2018 J jnl
Fault localization of a switched mode power supply based on extended integer-coded dictionary method.
Microelectron. Reliab.
Xuerong Ye, Cen Chen, Guofu Zhai
2018 J jnl
Lifetime prediction of aluminum electrolytic capacitors in LED drivers considering parameter shifts.
Microelectron. Reliab.
Hao Niu, Shujuan Wang, Xuerong Ye, Huai Wang, Frede Blaabjerg
2018 J jnl
Manufacturing process-based storage degradation modelling and reliability assessment.
Microelectron. Reliab.
Xuerong Ye, Yigang Lin, Qingmin Wang, Hao Niu, Guofu Zhai
2018 J jnl
The threshold voltage degradation model of N Channel VDMOSFETs under PBT stress.
Microelectron. Reliab.
Xuerong Ye, Kaixin Zhang, Cen Chen, Zhongwei Li, Yue Wang, Guofu Zhai
2018 J jnl
VDMOSFET HEF degradation modelling considering turn-around phenomenon.
Microelectron. Reliab.
Xuerong Ye, Cen Chen, Yixing Wang, L. Wang, Guofu Zhai
2015 J jnl
A Tolerance Design Method for Electronic Circuits Based on Performance Degradation.
Qual. Reliab. Eng. Int.
Guofu Zhai, Yuege Zhou, Xuerong Ye
2011 J jnl
Failure Process and Dynamic Reliability Estimation of Sealed Relay.
IEICE Trans. Electron.
Xuerong Ye, Jie Deng, Qiong Yu, Guofu Zhai
2009 J jnl
Research on Dynamic Characteristics Testing and Analyzing System of Electromagnetic Relay.
IEICE Trans. Electron.
Xuerong Ye, Huimin Liang, Jie Deng, Guofu Zhai
2006 J jnl
Research on the Tolerance Distribution of Sealed Electromagnetic Relay with Reliability Index.
IEICE Trans. Electron.
Huimin Liang, Xuerong Ye, Guofu Zhai