| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2026 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2026 | J | jnl |
Comput. Ind. Eng.
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
Pattern Recognit.
|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2024 | J | jnl |
Comput. Ind. Eng.
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
Vis. Comput.
|
| 2024 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2024 | J | jnl |
J. Comput. Appl. Math.
|
| 2024 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2024 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2024 | J | jnl |
Comput. Ind. Eng.
|
| 2024 | J | jnl |
Comput. Ind. Eng.
|
| 2024 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2024 | J | jnl |
Comput. Ind. Eng.
|
| 2023 | J | jnl |
Image Vis. Comput.
|
| 2023 | J | jnl |
Mach. Vis. Appl.
|
| 2023 | J | jnl |
Comput. Electr. Eng.
|
| 2023 | J | jnl |
Comput. Ind. Eng.
|
| 2023 | J | jnl |
Comput. Ind. Eng.
|
| 2023 | J | jnl |
Comput. Ind. Eng.
|
| 2023 | J | jnl |
Multim. Tools Appl.
|
| 2023 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2023 | J | jnl |
Comput. Ind. Eng.
|
| 2023 | J | jnl |
Vis. Comput.
|
| 2023 | J | jnl |
Inf. Process. Manag.
|
| 2022 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2022 | J | jnl |
A one-sided adaptive truncated exponentially weighted moving average scheme for time between events.
Comput. Ind. Eng.
|
| 2022 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2022 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2022 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2022 | — | conf |
PRCV (4)
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
Vis. Comput.
|
| 2022 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2022 | J | jnl |
Symmetry
|
| 2022 | J | jnl |
Symmetry
|
| 2022 | J | jnl |
Comput. Ind. Eng.
|
| 2022 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2021 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2021 | J | jnl |
Image Vis. Comput.
|
| 2021 | — | conf |
ICIG (3)
|
| 2021 | J | jnl |
Int. J. Emerg. Technol. Learn.
|
| 2021 | — | conf |
ICIG (1)
|
| 2021 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2021 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2021 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2021 | J | jnl |
Comput. Electron. Agric.
|
| 2021 | J | jnl |
Comput. Ind. Eng.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2020 | J | jnl |
IEEE Trans. Cybern.
|
| 2020 | J | jnl |
Vis. Comput.
|
| 2020 | J | jnl |
IEEE Trans. Image Process.
|
| 2019 | J | jnl |
Comput. Ind. Eng.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
Comput. Ind. Eng.
|
| 2019 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2019 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2018 | — | conf |
ECCV (9)
|
| 2018 | J | jnl |
CoRR
|
| 2018 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2017 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2017 | — | conf |
CCNC
|
| 2017 | C | conf |
ICCE
|
| 2017 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2017 | — | conf |
CCNC
|
| 2017 | — | conf |
CCNC
|
| 2016 | — | conf |
WCSP
|
| 2016 | — | conf |
ICTC
|
| 2016 | — | conf |
WCSP
|
| 2016 | J | jnl |
Pattern Recognit.
|
| 2016 | — | conf |
WCSP
|
| 2016 | J | jnl |
CoRR
|
| 2016 | — | conf |
DSP
|
| 2016 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2015 | — | conf |
ICIG (1)
|
| 2015 | C | conf |
APCC
|
| 2015 | — | conf |
ICIG (3)
|
| 2015 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2014 | — | conf |
ChinaCom
|
| 2013 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2010 | J | jnl |
J. Digit. Content Technol. its Appl.
|