Xuebing Cao

11 papers C 1Journal 6Unranked 4
YearRankTypeTitle / Venue / Authors
2022 J jnl
Vision-Based Finger Tapping Test in Patients With Parkinson's Disease via Spatial-Temporal 3D Hand Pose Estimation.
IEEE J. Biomed. Health Informatics
Zhilin Guo, Weiqi Zeng, Taidong Yu, Yan Xu, Yang Xiao, Xuebing Cao, Zhiguo Cao
2020 J jnl
An Adjustable and Fast Error Repair Scrubbing Method Based on Xilinx Essential Bits Technology for SRAM-Based FPGA.
IEEE Trans. Reliab.
Rongsheng Zhang, Liyi Xiao, Jie Li, Xuebing Cao, Linzhe Li
2020 J jnl
From Coarse to Fine (FC2F): A New Scheme of Colorizing Thermal Infrared Images.
IEEE Access
Feiyan Cheng, Junsheng Shi, Lijun Yun, Xuebing Cao, Jun Zhang
2019 J jnl
A Layout-Based Soft Error Vulnerability Estimation Approach for Combinational Circuits Considering Single Event Multiple Transients (SEMTs).
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Xuebing Cao, Liyi Xiao, Jie Li, Rongsheng Zhang, Shanshan Liu, Jinxiang Wang
2019 — conf
Simulation of Proton Induced Single Event Upsets in Bulk Nano-CMOS SRAMs.
ICICDT
Xuebing Cao, Liyi Xiao, Linzhe Li, Jie Li, Tianqi Wang
2018 J jnl
A fast fault injection platform of multiple SEUs for SRAM-based FPGAs.
Microelectron. Reliab.
Rongsheng Zhang, Liyi Xiao, Jie Li, Xuebing Cao, Chunhua Qi, Jiaqiang Li, Mingjiang Wang
2018 J jnl
Design of Area-Efficient and Highly Reliable RHBD 10T Memory Cell for Aerospace Applications.
IEEE Trans. Very Large Scale Integr. Syst.
Jing Guo, Lei Zhu, Yu Sun, Huiliang Cao, Hai Huang, Tianqi Wang, Chunhua Qi, Rongsheng Zhang, Xuebing Cao, Liyi Xiao, Zhigang Mao
2018 C conf
Soft error optimization of combinational circuit based on gate sizing and multi-objective particle swarm optimization algorithm.
IOLTS
Xuebing Cao, Liyi Xiao, Linzhe Li, Jie Li, Jiaqiang Li, Jinxiang Wang
2017 — conf
A 13T radiation-hardened memory cell for low-voltage operation and ultra-low power space applications.
ISQED
Chunhua Qi, Liyi Xiao, Mingxue Huo, Tianqi Wang, Rongsheng Zhang, Xuebing Cao
2017 — conf
A method to estimate cross-section of circuits at RTL levels.
ASICON
Liyi Xiao, Anlong Li, Xuebing Cao, Hongchen Li, Rongsheng Zhang, Jie Li, Tianqi Wang
2017 — conf
Reliability analysis of memories suffering MBUs for the effect of negative bias temperature instability.
ASP-DAC
Shanshan Liu, Liyi Xiao, Xuebing Cao, Zhigang Mao