| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2020 | J | jnl |
CoRR
|
| 2015 | J | jnl |
J. Electron. Test.
|
| 2014 | — | conf |
ATS
|
| 2013 | J | jnl |
IEEE J. Solid State Circuits
|
| 2013 | B | conf |
ETS
|
| 2013 | A | conf |
ICCAD
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2011 | B | conf |
ETS
|
| 2011 | — | conf |
ASP-DAC
|
| 2011 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2010 | A | conf |
DATE
|
| 2010 | Misc | conf |
VTS
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | — | conf |
ASP-DAC
|
| 2006 | — | conf |
ASP-DAC
|