| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Multim. Syst.
|
| 2025 | — | conf |
BDIOT
|
| 2025 | — | conf |
BDIOT
|
| 2025 | — | conf |
BDIOT
|
| 2025 | — | conf |
BDIOT
|
| 2025 | — | conf |
BDIOT
|
| 2025 | — | conf |
BDIOT
|
| 2025 | J | jnl |
IEEE Access
|
| 2024 | — | conf |
BDIOT
|
| 2024 | J | jnl |
J. Electronic Imaging
|
| 2024 | — | conf |
BDIOT
|
| 2023 | J | jnl |
Vis. Comput.
|
| 2023 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2023 | — | conf |
BDIOT
|
| 2023 | J | jnl |
J. Electronic Imaging
|
| 2022 | — | conf |
BDIOT
|
| 2022 | J | jnl |
IEEE Wirel. Commun. Lett.
|
| 2022 | J | jnl |
IEEE Geosci. Remote. Sens. Lett.
|
| 2022 | J | jnl |
IEEE Signal Process. Lett.
|
| 2022 | J | jnl |
Appl. Math. Comput.
|
| 2020 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2020 | J | jnl |
IEEE Commun. Lett.
|
| 2019 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2019 | J | jnl |
IEEE Signal Process. Lett.
|
| 2019 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2018 | J | jnl |
Multim. Tools Appl.
|
| 2018 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2018 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2017 | J | jnl |
J. Control. Sci. Eng.
|
| 2017 | J | jnl |
Expert Syst. Appl.
|
| 2013 | J | jnl |
Sensors
|
| 2013 | J | jnl |
Pattern Recognit.
|
| 2009 | J | jnl |
Int. J. Wavelets Multiresolution Inf. Process.
|
| 2006 | — | conf |
RSKT
|
| 2006 | C | conf |
ADMA
|