| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2026 | A* | conf |
AAAI
|
| 2026 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2026 | J | jnl |
Pattern Recognit.
|
| 2026 | J | jnl |
Pattern Recognit.
|
| 2025 | — | conf |
PRCV (8)
|
| 2025 | B | conf |
ICPADS
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2025 | — | conf |
PRCV (8)
|
| 2025 | — | conf |
CACML
|
| 2025 | J | jnl |
IEEE Commun. Lett.
|
| 2025 | B | conf |
ICMR
|
| 2025 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2025 | J | jnl |
Pattern Recognit.
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Comput. Secur.
|
| 2024 | J | jnl |
Appl. Soft Comput.
|
| 2024 | — | conf |
SecureComm (3)
|
| 2024 | J | jnl |
Appl. Soft Comput.
|
| 2024 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2024 | J | jnl |
Comput. Secur.
|
| 2024 | J | jnl |
IEEE Internet Things J.
|
| 2024 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
J. King Saud Univ. Comput. Inf. Sci.
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2023 | J | jnl |
Comput. Secur.
|
| 2023 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | J | jnl |
J. Electronic Imaging
|