Xin Huang

20 papers A* 3A 5Journal 7Unranked 4
YearRankTypeTitle / Venue / Authors
2017 J jnl
Dynamic electromigration modeling for transient stress evolution and recovery under time-dependent current and temperature stressing.
Integr.
Xin Huang, Valeriy Sukharev, Taeyoung Kim, Sheldon X.-D. Tan
2016 J jnl
Analytical Modeling and Characterization of Electromigration Effects for Multibranch Interconnect Trees.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Hai-Bao Chen, Sheldon X.-D. Tan, Xin Huang, Taeyoung Kim, Valeriy Sukharev
2016 J jnl
EM-Based On-Chip Aging Sensor for Detection of Recycled ICs.
IEEE Des. Test
Kai He, Xin Huang, Sheldon X.-D. Tan
2016 J jnl
Electromigration assessment for power grid networks considering temperature and thermal stress effects.
Integr.
Xin Huang, Valeriy Sukharev, Jun-Ho Choy, Marko Chew, Taeyoung Kim, Sheldon X.-D. Tan
2016 — conf
Electromigration recovery modeling and analysis under time-dependent current and temperature stressing.
ASP-DAC
Xin Huang, Valeriy Sukharev, Taeyoung Kim, Hai-Bao Chen, Sheldon X.-D. Tan
2016 A conf
Learning-based dynamic reliability management for dark silicon processor considering EM effects.
DATE
Taeyoung Kim, Xin Huang, Hai-Bao Chen, Valeriy Sukharev, Sheldon X.-D. Tan
2016 J jnl
Physics-Based Electromigration Models and Full-Chip Assessment for Power Grid Networks.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Xin Huang, Armen Kteyan, Sheldon X.-D. Tan, Valeriy Sukharev
2016 — —
Physics-Based Electromigration and Time Dependent Dielectric Breakdown Modeling and Reliability Analysis for Nanometer VLSI Circuits
Xin Huang
2016 A* conf
Physics-based full-chip TDDB assessment for BEOL interconnects.
DAC
Xin Huang, Valeriy Sukharev, Zhongdong Qi, Taeyoung Kim, Sheldon X.-D. Tan
2016 A conf
Voltage-based electromigration immortality check for general multi-branch interconnects.
ICCAD
Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff, Taeyoung Kim, Xin Huang, Sheldon X.-D. Tan
2015 A conf
EM-Based on-Chip Aging Sensor for Detection and Prevention of Counterfeit and Recycled ICs.
ICCAD
Kai He, Xin Huang, Sheldon X.-D. Tan
2015 J jnl
H
Int. J. Circuit Theory Appl.
Hai-Bao Chen, Sheldon X.-D. Tan, David H. Shin, Xin Huang, Hai Wang, Guoyong Shi
2015 A* conf
Interconnect reliability modeling and analysis for multi-branch interconnect trees.
DAC
Hai-Bao Chen, Sheldon X.-D. Tan, Valeriy Sukharev, Xin Huang, Taeyoung Kim
2015 — conf
New electromigration modeling and analysis considering time-varying temperature and current densities.
ASP-DAC
Hai-Bao Chen, Sheldon X.-D. Tan, Xin Huang, Valeriy Sukharev
2015 J jnl
Task Migrations for Distributed Thermal Management Considering Transient Effects.
IEEE Trans. Very Large Scale Integr. Syst.
Zao Liu, Sheldon X.-D. Tan, Xin Huang, Hai Wang
2014 A conf
Accurate full-chip estimation of power map, current densities and temperature for EM assessment.
ICCAD
Marko Chew, Ara Aslyan, Jun-Ho Choy, Xin Huang
2014 — conf
Direct finite-element-based solver for 3D-IC thermal analysis via H-matrix representation.
ISQED
Ying-Chi Li, Sheldon X.-D. Tan, Tan Yu, Xin Huang, Ngai Wong
2014 A conf
IR-drop based electromigration assessment: parametric failure chip-scale analysis.
ICCAD
Valeriy Sukharev, Xin Huang, Hai-Bao Chen, Sheldon X.-D. Tan
2014 A* conf
Physics-based Electromigration Assessment for Power Grid Networks.
DAC
Xin Huang, Tan Yu, Valeriy Sukharev, Sheldon X.-D. Tan
2013 — conf
Distributed task migration for thermal hot spot reduction in many-core microprocessors.
ASICON
Zao Liu, Xin Huang, Sheldon X.-D. Tan, Hai Wang, He Tang