Xiaozhi Du

16 papers C 1Journal 13Unranked 2
YearRankTypeTitle / Venue / Authors
2025 J jnl
A Multi-Objective Test Scenario Prioritization Method Based on UML Activity Diagram.
J. Electron. Test.
Xiaozhi Du, Kai Chen, Zongbin Qiao
2025 J jnl
DMVL4AVD: a deep multi-view learning model for automated vulnerability detection.
Neural Comput. Appl.
Xiaozhi Du, Yanrong Zhou, Hongyuan Du
2025 J jnl
Just-in-time software defect location for mobile applications based on pre-trained programming encoder model and hierarchical attention network.
Eng. Appl. Artif. Intell.
Xiaozhi Du, Xue Yuan, Zongbin Qiao
2025 J jnl
ReAPR: Automatic program repair via retrieval-augmented large language models.
Softw. Qual. J.
Zixin Liu, Xiaozhi Du, Hairui Liu
2024 J jnl
A vulnerability severity prediction method based on bimodal data and multi-task learning.
J. Syst. Softw.
Xiaozhi Du, Shiming Zhang, Yanrong Zhou, Hongyuan Du
2024 J jnl
FST-OAM: a fast style transfer model using optimized self-attention mechanism.
Signal Image Video Process.
Xiaozhi Du, Ning Jia, Hongyuan Du
2023 J jnl
An orthodontic path planning method based on improved gray wolf optimization algorithm.
Soft Comput.
Xiaozhi Du, Ting Yu, Kai Chen
2023 J jnl
DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram.
J. Electron. Test.
Xiaozhi Du, Jinjin Zhang, Kai Chen, Yanrong Zhou
2022 J jnl
Submodel Comparison Method Based on IFC File Content.
J. Comput. Civ. Eng.
Xiaozhi Du, Yurong Duan
2020 — conf
Extracting Entities and Relations by an End-to-End Neural Model with Multi-Layer Encoder.
HPCCT/BDAI
Yingying Yu, Linting Huang, Xiaozhi Du, Wei Huang
2020 J jnl
IFC File Content Compression Based on Reference Relationships.
J. Comput. Civ. Eng.
Xiaozhi Du, Yunxiao Gu, Nan Yang, Fengshuang Yang
2018 J jnl
A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error.
J. Electron. Test.
Xiaozhi Du, Dongyang Luo, Chaohui He, Shuhuan Liu
2018 J jnl
FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC.
J. Electron. Test.
Xiaozhi Du, Dongyang Luo, Kailun Shi, Chaohui He, Shuhuan Liu
2017 J jnl
Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip.
Microelectron. Reliab.
Xuecheng Du, Shuhuan Liu, Dongyang Luo, Yao Zhang, Xiaozhi Du, Chaohui He, Xiaotang Ren, Weitao Yang, Yuan Yuan
2009 C conf
A Mixed Software Rejuvenation Policy for Multiple Degradations Software System.
HPCC
Xiaozhi Du, Yong Qi, Di Hou, Ying Chen, Xiao Zhong
2009 — conf
Modeling and Performance Analysis of Software Rejuvenation Policies for Multiple Degradation Systems.
COMPSAC (1)
Xiaozhi Du, Yong Qi, Di Hou, Ying Chen, Xiao Zhong