| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Inf. Fusion
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
Sensors
|
| 2024 | A* | conf |
SIGGRAPH Asia
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Geosci. Remote. Sens.
|
| 2023 | A* | conf |
SIGGRAPH Asia
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Remote. Sens.
|
| 2023 | B | conf |
SMC
|
| 2022 | J | jnl |
IEEE Trans. Geosci. Remote. Sens.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | — | conf |
SIGGRAPH (Conference Paper Track)
|
| 2022 | J | jnl |
CoRR
|
| 2021 | J | jnl |
Comput. Aided Geom. Des.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
Proc. ACM Comput. Graph. Interact. Tech.
|
| 2018 | J | jnl |
Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model.
Microelectron. Reliab.
|