| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2024 | — | conf |
ICSRS
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2022 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2022 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2022 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2022 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2019 | J | jnl |
IEEE Trans. Fuzzy Syst.
|
| 2019 | J | jnl |
IEEE Trans. Fuzzy Syst.
|
| 2018 | J | jnl |
J. Intell. Fuzzy Syst.
|
| 2018 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | — | conf |
QRS Companion
|
| 2018 | — | conf |
QRS Companion
|
| 2017 | J | jnl |
A Bayesian Optimal Design for Accelerated Degradation Testing Based on the Inverse Gaussian Process.
IEEE Access
|
| 2017 | J | jnl |
Entropy
|
| 2017 | J | jnl |
IEEE Trans. Reliab.
|
| 2017 | — | conf |
ICSRS
|
| 2017 | — | conf |
ICSRS
|
| 2017 | J | jnl |
IEEE Trans. Reliab.
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
Sensors
|
| 2016 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2013 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2011 | — | conf |
IEEM
|