| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Learn. Technol.
|
| 2023 | C | conf |
SAFEPROCESS
|
| 2022 | J | jnl |
IEEE Trans. Learn. Technol.
|
| 2022 | J | jnl |
IEEE Syst. J.
|
| 2022 | C | conf |
iLRN
|
| 2021 | J | jnl |
Complex.
|
| 2021 | C | conf |
CSCWD
|
| 2021 | J | jnl |
Math. Comput. Simul.
|
| 2021 | J | jnl |
Int. J. Control
|
| 2020 | J | jnl |
Appl. Math. Lett.
|
| 2020 | J | jnl |
J. Frankl. Inst.
|
| 2020 | J | jnl |
Int. J. Control
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
J. Frankl. Inst.
|
| 2017 | C | conf |
IECON
|
| 2017 | — | conf |
ASCC
|