Xiaoxin Fan

11 papers A 2C 1Misc 1Journal 1Unranked 6
YearRankTypeTitle / Venue / Authors
2022 J jnl
C-Testing and Efficient Fault Localization for AI Accelerators.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty
2020 — conf
C-Testing of AI Accelerators
ATS
Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty
2013 Misc conf
Distributed dynamic partitioning based diagnosis of scan chain.
VTS
Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy
2012 — conf
Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns.
Asian Test Symposium
Xiaoxin Fan, Manish Sharma, Wu-Tung Cheng, Sudhakar M. Reddy
2012 A conf
Improved volume diagnosis throughput using dynamic design partitioning.
ITC
Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware
2011 — conf
Genetic algorithm based approach for segmented testing.
DSN Workshops
Xiaoxin Fan, Sudhakar M. Reddy, Senling Wang, Seiji Kajihara, Yasuo Sato
2011 C conf
Max-Fill: A method to generate high quality delay tests.
DDECS
Xiaoxin Fan, Sudhakar M. Reddy, Irith Pomeranz
2011 — conf
On Using Design Partitioning to Reduce Diagnosis Memory Footprint.
Asian Test Symposium
Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware
2008 — conf
Localized random access scan: Towards low area and routing overhead.
ASP-DAC
Yu Hu, Xiang Fu, Xiaoxin Fan, Hideo Fujiwara
2007 — conf
An On-Chip Test Clock Control Scheme for Multi-Clock At-Speed Testing.
ATS
Xiaoxin Fan, Yu Hu, Laung-Terng Wang
2007 A conf
The design-for-testability features of a general purpose microprocessor.
ITC
Da Wang, Xiaoxin Fan, Xiang Fu, Hui Liu, Ke Wen, Rui Li, Huawei Li, Yu Hu, Xiaowei Li