| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Microelectron. J.
|
| 2025 | J | jnl |
Sci. China Inf. Sci.
|
| 2024 | J | jnl |
Variations of single event transient induced by line edge roughness (LER) and temperature in FinFET.
Microelectron. J.
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2017 | C | conf |
ICIS
|
| 2012 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2012 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2012 | J | jnl |
Microelectron. J.
|
| 2012 | J | jnl |
Microelectron. J.
|
| 2011 | J | jnl |
Microelectron. J.
|
| 2010 | J | jnl |
Microelectron. J.
|