| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Int. J. Inf. Commun. Technol.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
Appl. Soft Comput.
|
| 2025 | J | jnl |
Comput.
|
| 2024 | J | jnl |
RAIRO Oper. Res.
|
| 2023 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2023 | J | jnl |
Modeling dynamic environment effects on dependent failure processes with varying failure thresholds.
Reliab. Eng. Syst. Saf.
|
| 2021 | J | jnl |
Wirel. Commun. Mob. Comput.
|
| 2018 | J | jnl |
Pattern Recognit.
|
| 2017 | A | conf |
ICDAR
|
| 2016 | J | jnl |
Pattern Recognit.
|
| 2016 | J | jnl |
Pattern Recognit. Lett.
|
| 2015 | A | conf |
ICDAR
|
| 2014 | B | conf |
ICPR
|