| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
CNML
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | — | conf |
SIGCSE (1)
|
| 2024 | — | conf |
ICCBN
|
| 2023 | C | conf |
FIE
|
| 2022 | J | jnl |
Sci. Eng. Ethics
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | J | jnl |
IEEE Technol. Soc. Mag.
|
| 2017 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2014 | C | conf |
DASC
|
| 2014 | J | jnl |
Sensors
|
| 2012 | J | jnl |
Int. J. Eng. Soc. Justice Peace
|