| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Microelectron. J.
|
| 2025 | J | jnl |
IEEE Trans. Broadcast.
|
| 2025 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2025 | J | jnl |
IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
|
| 2025 | J | jnl |
Appl. Intell.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2024 | J | jnl |
Scientometrics
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
Microelectron. J.
|
| 2023 | J | jnl |
Int. J. Manuf. Technol. Manag.
|
| 2023 | — | conf |
ICDSST
|
| 2022 | J | jnl |
IEICE Electron. Express
|
| 2022 | J | jnl |
Int. J. Manuf. Technol. Manag.
|
| 2020 | J | jnl |
Circuits Syst. Signal Process.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | — | conf |
ICGDA
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
ISICA
|
| 2019 | J | jnl |
Remote. Sens.
|
| 2018 | J | jnl |
Zone control charts with estimated parameters for detecting prespecified changes in linear profiles.
Commun. Stat. Simul. Comput.
|
| 2017 | J | jnl |
Wirel. Pers. Commun.
|
| 2016 | J | jnl |
Ars Comb.
|
| 2014 | — | conf |
BIBM
|
| 2014 | J | jnl |
IEICE Trans. Electron.
|
| 2013 | J | jnl |
IEICE Electron. Express
|
| 2013 | J | jnl |
BMC Bioinform.
|
| 2012 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2011 | J | jnl |
IEICE Electron. Express
|