| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Signal Process. Lett.
|
| 2026 | J | jnl |
IEEE Signal Process. Lett.
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2024 | J | jnl |
Neurocomputing
|
| 2024 | J | jnl |
J. Electronic Imaging
|
| 2022 | J | jnl |
J. Electronic Imaging
|
| 2022 | J | jnl |
Int. J. Digit. Multim. Broadcast.
|
| 2022 | J | jnl |
Displays
|
| 2021 | J | jnl |
A novel holes filling method based on layered depth map and patch sparsity for complex-scene images.
Microelectron. J.
|
| 2021 | J | jnl |
IEEE Access
|