| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Pattern Recognit.
|
| 2026 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2026 | J | jnl |
Biomed. Signal Process. Control.
|
| 2026 | J | jnl |
IEEE Trans. Biomed. Eng.
|
| 2026 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2026 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Comput. Vis. Image Underst.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Digit. Signal Process.
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
Signal Process.
|
| 2024 | J | jnl |
J. Frankl. Inst.
|
| 2024 | J | jnl |
Comput. Vis. Image Underst.
|
| 2024 | C | conf |
IECON
|
| 2023 | J | jnl |
IEEE Trans. Neural Networks Learn. Syst.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2023 | C | conf |
IECON
|
| 2023 | C | conf |
IECON
|
| 2023 | J | jnl |
IEEE Trans. Multim.
|
| 2023 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2022 | J | jnl |
Signal Process.
|
| 2022 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2021 | J | jnl |
Identification of switched FIR systems with random missing outputs: A variational Bayesian approach.
J. Frankl. Inst.
|
| 2021 | J | jnl |
Int. J. Syst. Sci.
|
| 2021 | J | jnl |
Int. J. Control
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | C | conf |
IECON
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | C | conf |
IECON
|
| 2020 | J | jnl |
Neurocomputing
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2020 | C | conf |
IECON
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2019 | J | jnl |
Neurocomputing
|
| 2019 | J | jnl |
J. Syst. Control. Eng.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2019 | J | jnl |
Neurocomputing
|
| 2019 | J | jnl |
J. Frankl. Inst.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
J. Frankl. Inst.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | — | conf |
ICIRA (2)
|
| 2018 | — | conf |
RCAR
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Trans. Cybern.
|
| 2018 | J | jnl |
Trans. Inst. Meas. Control
|
| 2018 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2018 | J | jnl |
Vis. Comput.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | C | conf |
IECON
|
| 2017 | C | conf |
IECON
|
| 2017 | J | jnl |
IET Image Process.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2017 | J | jnl |
J. Frankl. Inst.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | J | jnl |
J. Frankl. Inst.
|
| 2016 | — | conf |
ISIE
|
| 2016 | — | conf |
ISIE
|
| 2014 | J | jnl |
J. Frankl. Inst.
|
| 2012 | J | jnl |
Neurocomputing
|