Xi Wang

11 papers Journal 11
YearRankTypeTitle / Venue / Authors
2026 J jnl
Neural Absolute Shift and Rotation Testing for Fizeau Interferometers.
IEEE Trans. Ind. Informatics
Xi Wang, GuoQing Sheng, JinYong Che, Duo Li, Xinquan Zhang, LiMin Zhu, Ming Jun Ren
2025 J jnl
A Phase Fusion and Restoration Method Based on Global Neural Calibration Model.
IEEE Trans. Instrum. Meas.
Xi Wang, Zhenxiong Jian, Duo Li, Xinquan Zhang, LiMin Zhu, Ming Jun Ren
2025 J jnl
Profile-Aided Subaperture Stitching Algorithm for the Measurement of Microlens Array Optics by Coherence Scanning Interferometry.
IEEE Trans. Instrum. Meas.
Jun Guo, Yijun Shen, Xi Wang, Lingwen Tan, Rong Su, Mingjun Ren
2024 J jnl
Anisotropic Neural Reflectance Model for Measuring Curved Machined Metal Surface.
IEEE Trans. Ind. Informatics
Xi Wang, Zhenxiong Jian, Daizhou Wen, Xinquan Zhang, LiMin Zhu, Ming Jun Ren
2024 J jnl
Robotic measurement system based on cooperative optical profiler integrating fringe projection with photometric stereo for highly reflective workpiece.
Robotics Comput. Integr. Manuf.
Xi Wang, Yijun Shen, Zhenxiong Jian, Daizhou Wen, Xinquan Zhang, Li-Min Zhu, Mingjun Ren
2024 J jnl
Task-Specific Near-Field Photometric Stereo for Measuring Metal Surface Texture.
IEEE Trans. Ind. Informatics
Zhenxiong Jian, Xi Wang, Xinquan Zhang, Rong Su, Ming Jun Ren, LiMin Zhu
2022 J jnl
Self-Calibrating Sparse Far-Field Photometric Stereo With Collocated Light.
IEEE Trans. Instrum. Meas.
Xi Wang, Zhenxiong Jian, Hang Yuan, Mingjun Ren
2021 J jnl
Complex Surface Reconstruction Based on Fusion of Surface Normals and Sparse Depth Measurement.
IEEE Trans. Instrum. Meas.
Jieji Ren, Zhenxiong Jian, Xi Wang, Mingjun Ren, LiMin Zhu, Xiangqian Jiang
2020 J jnl
Multiscale Convolutional Fusion Network for Non-Lambertian Photometric Stereo.
IEEE Signal Process. Lett.
Jieji Ren, Xi Wang, Zhenxiong Jian, Ming Jun Ren
2020 J jnl
Non-Lambertian Photometric Stereo Network Based on Inverse Reflectance Model With Collocated Light.
IEEE Trans. Image Process.
Xi Wang, Zhenxiong Jian, Ming Jun Ren
2019 J jnl
Fast Defect Inspection Based on Data-Driven Photometric Stereo.
IEEE Trans. Instrum. Meas.
Mingjun Ren, Xi Wang, Gaobo Xiao, Minghan Chen, Lin Fu