Xavier Perpiñà

25 papers A 1Journal 23Unranked 1
YearRankTypeTitle / Venue / Authors
2024 J jnl
Measurement Uncertainty in Fourier Coefficient- Based Time Series Reconstruction Considering Calibration Effects in Thermal Imaging.
IEEE Trans. Instrum. Meas.
Roger Solé, Conrad Ferrer, Oriol Avino-Salvado, Xavier Jordà, Xavier Perpiñà
2024 J jnl
Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs.
IEEE Trans. Ind. Electron.
Oriol Avino-Salvado, Cyril Buttay, Ferran Bonet, Christophe Raynaud, Pascal Bevilacqua, José Rebollo, Hervé Morel, Xavier Perpiñà
2023 J jnl
Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics.
IEEE Trans. Instrum. Meas.
Conrad Ferrer, Oriol Avino-Salvado, Miquel Vellvehí, Xavier Jordà, Xavier Perpiñà
2021 J jnl
BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits.
Sensors
Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragonès, Xavier Perpiñà, Ferran Reverter
2021 J jnl
Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits.
IEEE Trans. Ind. Electron.
Miquel Vellvehí, Xavier Perpiñà, Javier Leon, Oriol Avino-Salvado, Conrad Ferrer, Xavier Jordà
2019 J jnl
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging.
IEEE Trans. Instrum. Meas.
Xavier Perpiñà, Ferran Reverter, Javier Leon, Enrique Barajas, Miquel Vellvehí, Xavier Jordà, Josep Altet
2019 J jnl
Solid-State Relay Solutions for Induction Cooking Applications Based on Advanced Power Semiconductor Devices.
IEEE Trans. Ind. Electron.
Manuel Fernandez, Xavier Perpiñà, José Rebollo, Miquel Vellvehí, David Sanchez, Tomás Cabeza, Sergio Llorente, Xavier Jordà
2017 J jnl
Short-Circuit Study in Medium-Voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTs.
IEEE Trans. Ind. Electron.
Manuel Fernandez, Xavier Perpiñà, Jaume Roig-Guitart, Miquel Vellvehí, Filip Bauwens, Marnix Tack, Xavier Jordà
2015 J jnl
Characterization of phase change material systems using a thermal test device.
Microelectron. J.
Xavier Jordà, Jesús Esarte, Xavier Perpiñà, Miquel Vellvehí, Gorka Argandoña, Maite Aresti
2015 J jnl
Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging.
IEEE Trans. Ind. Electron.
Javier Leon, Xavier Perpiñà, Jordi Sacristán, Miquel Vellvehí, Antoni Baldi, Xavier Jordà
2014 J jnl
Comparison of temperature limits for Trench silicon IGBT technologies for medium power applications.
Microelectron. Reliab.
Xavier Perpiñà, Xavier Jordà, Javier Leon, Miquel Vellvehí, Daniel Antón, Sergio Llorente
2014 J jnl
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers.
Microelectron. J.
Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà
2014 — conf
Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing.
ESSDERC
Javier Leon, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà, Philippe Godignon
2014 J jnl
Temperature effects on the ruggedness of SiC Schottky diodes under surge current.
Microelectron. Reliab.
Javier Leon, Xavier Perpiñà, Viorel Banu, Josep Montserrat, Maxime Berthou, Miquel Vellvehí, Philippe Godignon, Xavier Jordà
2013 J jnl
Thermal resistance investigations on new leadframe-based LED packages and boards.
Microelectron. Reliab.
B. Pardo, A. Gasse, A. Fargeix, Jiri Jakovenko, Robert J. Werkhoven, Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, T. Van Weelden, P. Bancken
2012 A conf
DC temperature measurements for power gain monitoring in RF power amplifiers.
ITC
Josep Altet, Diego Mateo, Didac Gómez, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà
2012 J jnl
Design for reliability of solid state lighting systems.
Microelectron. Reliab.
Xavier Perpiñà, Robert J. Werkhoven, Jiri Jakovenko, J. Formánek, Miquel Vellvehí, Xavier Jordà, Jos M. G. Kunen, Peter Bancken, Pieter Jan Bolt
2012 J jnl
Enhanced power cycling capability of SiC Schottky diodes using press pack contacts.
Microelectron. Reliab.
Viorel Banu, Philippe Godignon, Xavier Perpiñà, Xavier Jordà, José Millán
2012 J jnl
Study of layout influence on ruggedness of NPT-IGBT devices by physical modelling.
Microelectron. Reliab.
Ignasi Cortés, Xavier Perpiñà, Jesús Urresti, Xavier Jordà, José Rebollo
2012 J jnl
Thermal cycling analysis of high temperature die-attach materials.
Microelectron. Reliab.
Luis A. Navarro, Xavier Perpiñà, Miquel Vellvehí, Viorel Banu, Xavier Jordà
2011 J jnl
Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions.
IEEE Trans. Ind. Electron.
Xavier Perpiñà, Jean-François Serviere, Jesús Urresti-Ibañez, Ignasi Cortés, Xavier Jordà, Salvador Hidalgo, José Rebollo, Michel Mermet-Guyennet
2011 J jnl
Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems.
IEEE Trans. Ind. Electron.
Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, José Rebollo, Michel Mermet-Guyennet
2011 J jnl
SiC Schottky Diodes for Harsh Environment Space Applications.
IEEE Trans. Ind. Electron.
Philippe Godignon, Xavier Jordà, Miquel Vellvehí, Xavier Perpiñà, Viorel Banu, Demetrio López, Juan Barbero, Pierre Brosselard, Silvia Massetti
2007 J jnl
Thermal fatigue effects on the temperature distribution inside IGBT modules for zone engine aeronautical applications.
Microelectron. Reliab.
T. Lhommeau, Xavier Perpiñà, C. Martin, Régis Meuret, Michel Mermet-Guyennet, Moussa Karama
2004 J jnl
Self-heating experimental study of 600V PT-IGBTs under low dissipation energies.
Microelectron. J.
Xavier Perpiñà, Xavier Jordà, N. Mestres, Miquel Vellvehí, Philippe Godignon, José Millán