| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2024 | J | jnl |
IEEE Trans. Reliab.
|
| 2019 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2017 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2016 | J | jnl |
Int. J. Mach. Learn. Cybern.
|
| 2014 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2014 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2012 | J | jnl |
Comput. Ind. Eng.
|
| 2011 | — | conf |
FGIT-ASEA/DRBC/EL
|
| 2010 | J | jnl |
OR Spectr.
|
| 2010 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2010 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2008 | J | jnl |
An Analysis of Accelerated Performance Degradation Tests Assuming the Arrhenius Stress-Relationship.
Asia Pac. J. Oper. Res.
|
| 2008 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2007 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2007 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2006 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2005 | — | conf |
ICCSA (4)
|
| 2005 | J | jnl |
Eur. J. Oper. Res.
|
| 2005 | J | jnl |
Int. Trans. Oper. Res.
|
| 2004 | J | jnl |
Comput. Ind. Eng.
|
| 2002 | J | jnl |
Reliab. Eng. Syst. Saf.
|