Wolfgang Stadler

17 papers Journal 16Unranked 1
YearRankTypeTitle / Venue / Authors
2009 J jnl
CDM tests on interface test chips for the verification of ESD protection concepts.
Microelectron. Reliab.
Tilo Brodbeck, Kai Esmark, Wolfgang Stadler
2009 J jnl
Do ESD fails in systems correlate with IC ESD robustness?
Microelectron. Reliab.
Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner
2009 J jnl
Editorial ESD reliability special section.
Microelectron. Reliab.
Vesselin K. Vassilev, Wolfgang Stadler
2009 J jnl
Reliability aspects of gate oxide under ESD pulse stress.
Microelectron. Reliab.
Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix
2009 J jnl
Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology.
Microelectron. Reliab.
Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler
2007 J jnl
Backside interferometric methods for localization of ESD-induced leakage current and metal shorts.
Microelectron. Reliab.
Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler
2007 J jnl
Guest editorial.
Microelectron. Reliab.
Wolfgang Stadler
2006 J jnl
Physical fundamentals of external transient latch-up and corrective actions.
Microelectron. Reliab.
Krzysztof Domanski, B. Póltorak, S. Bargstädt-Franke, Wolfgang Stadler, Waclaw Bala
2005 J jnl
Capacitively coupled transmission line pulsing cc-TLP--a traceable and reproducible stress method in the CDM-domain.
Microelectron. Reliab.
Heinrich Wolf, Horst A. Gieser, Wolfgang Stadler, Wolfgang Wilkening
2005 J jnl
Guest editorial.
Microelectron. Reliab.
Wolfgang Stadler
2005 J jnl
High abstraction level permutational ESD concept analysis.
Microelectron. Reliab.
Martin Streibl, Franz Zängl, Kai Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel
2005 J jnl
Test circuits for fast and reliable assessment of CDM robustness of I/O stages.
Microelectron. Reliab.
Wolfgang Stadler, Kai Esmark, K. Reynders, M. Zubeidat, Michael Graf, Wolfgang Wilkening, J. Willemen, Ning Qu, S. Mettler, M. Etherton
2005 J jnl
Transient latch-up: experimental analysis and device simulation.
Microelectron. Reliab.
S. Bargstädt-Franke, Wolfgang Stadler, Kai Esmark, Martin Streibl, Krzysztof Domanski, Horst A. Gieser, Heinrich Wolf, Waclaw Bala
2003 J jnl
Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies.
Microelectron. Reliab.
Martin Streibl, Kai Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner
2002 J jnl
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development.
Microelectron. Reliab.
Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik
2001 J jnl
Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phase.
Microelectron. Reliab.
Kai Esmark, Wolfgang Stadler, M. Wendel, Harald Gossner, X. Guggenmos, Wolfgang Fichtner
1993 — conf
Einführung verteilter Systeme in einem Unternehmen der Markenartikelindustrie - Organisatorische Konsequenzen.
GI-Fachgespräch über Rechenzentren
Wolfgang Stadler