| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment.
J. Electron. Test.
|
| 2011 | A | conf |
SC
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2010 | — | conf |
ESSCIRC
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2010 | B | conf |
ETS
|
| 2010 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2009 | J | jnl |
Microelectron. Reliab.
|
| 2009 | J | jnl |
Microelectron. Reliab.
|
| 2009 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2009 | C | conf |
ISCAS
|
| 2009 | A | conf |
DATE
|
| 2009 | J | jnl |
Microelectron. J.
|
| 2009 | C | conf |
ISCAS
|
| 2009 | J | jnl |
Microelectron. Reliab.
|
| 2009 | B | conf |
ETS
|
| 2009 | C | conf |
ISCAS
|
| 2008 | — | conf |
Euro-Par
|
| 2008 | — | conf |
SoC
|
| 2008 | — | conf |
APCCAS
|
| 2008 | C | conf |
ISCAS
|
| 2008 | — | conf |
WiNTECH
|
| 2008 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2008 | C | conf |
ISCAS
|
| 2007 | — | conf |
CICC
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2007 | J | jnl |
IEEE Trans. Biomed. Eng.
|
| 2007 | C | conf |
ISCAS
|
| 2007 | C | conf |
ISCAS
|
| 2007 | J | jnl |
SIAM J. Sci. Comput.
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2007 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2007 | C | conf |
ISCAS
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2007 | — | conf |
EUSIPCO
|
| 2007 | C | conf |
ISCAS
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2007 | C | conf |
ISCAS
|
| 2006 | C | conf |
ISCAS
|
| 2006 | — | conf |
ICASSP (4)
|
| 2006 | C | conf |
ISCAS
|
| 2006 | — | conf |
EMBC
|
| 2006 | J | jnl |
Microelectron. Reliab.
|
| 2006 | J | jnl |
Microelectron. Reliab.
|
| 2006 | — | conf |
ASYNC
|
| 2006 | C | conf |
ISCAS
|
| 2006 | A* | conf |
DAC
|
| 2006 | J | jnl |
SIAM J. Appl. Math.
|
| 2006 | J | jnl |
Microelectron. Reliab.
|
| 2006 | C | conf |
ISCAS
|
| 2006 | A | conf |
DATE
|
| 2006 | — | conf |
EUSIPCO
|
| 2005 | — | conf |
ECCTD
|
| 2005 | — | conf |
ESSCIRC
|
| 2005 | J | jnl |
Microelectron. Reliab.
|
| 2005 | — | conf |
FMGALS@MEMOCODE
|
| 2005 | J | jnl |
Microelectron. Reliab.
|
| 2005 | — | conf |
ESSCIRC
|
| 2005 | — | conf |
PATMOS
|
| 2005 | J | jnl |
Microelectron. Reliab.
|
| 2005 | J | jnl |
IEEE J. Solid State Circuits
|
| 2004 | J | jnl |
Microelectron. Reliab.
|
| 2004 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2004 | J | jnl |
Characterization of self-heating effects in semiconductor resistors during transmission line pulses.
Microelectron. Reliab.
|
| 2004 | J | jnl |
Microelectron. Reliab.
|
| 2004 | — | conf |
ESSCIRC
|
| 2004 | — | conf |
ESSCIRC
|
| 2003 | — | conf |
ICECS
|
| 2003 | J | jnl |
Microelectron. Reliab.
|
| 2003 | J | jnl |
Inf. Syst. E Bus. Manag.
|
| 2003 | J | jnl |
Microelectron. Reliab.
|
| 2003 | J | jnl |
Math. Comput. Simul.
|
| 2003 | — | conf |
ASYNC
|
| 2003 | — | conf |
ISCAS (5)
|
| 2003 | J | jnl |
IEEE Trans. Signal Process.
|
| 2002 | A | conf |
CHES
|
| 2002 | — | conf |
ASYNC
|
| 2002 | J | jnl |
Microelectron. Reliab.
|
| 2002 | J | jnl |
VLSI Design
|
| 2002 | J | jnl |
Microelectron. Reliab.
|
| 2002 | J | jnl |
Microelectron. Reliab.
|
| 2001 | — | conf |
ISCAS (3)
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 2001 | J | jnl |
IEEE Micro
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 2001 | J | jnl |
Future Gener. Comput. Syst.
|
| 2001 | J | jnl |
VLSI Design
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 2000 | J | jnl |
IEEE J. Solid State Circuits
|
| 2000 | — | conf |
CICC
|
| 2000 | — | conf |
ASYNC
|
| 1999 | — | conf |
ISHPC
|
| 1999 | A | conf |
ITC
|
| 1999 | — | conf |
HPCN Europe
|
| 1998 | — | conf |
CICC
|
| 1998 | J | jnl |
VLSI Design
|
| 1998 | J | jnl |
VLSI Design
|
| 1997 | J | jnl |
IEEE J. Solid State Circuits
|
| 1997 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1996 | — | conf |
ICECS
|
| 1996 | — | conf |
ICECS
|
| 1995 | — | conf |
PP
|
| 1994 | J | jnl |
IEEE J. Solid State Circuits
|
| 1994 | J | jnl |
SIAM J. Sci. Comput.
|
| 1993 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1993 | A | conf |
ITC
|
| 1992 | J | jnl |
SIAM J. Sci. Comput.
|
| 1992 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1992 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1992 | — | conf |
IFIP Congress (1)
|
| 1992 | A | conf |
ICCAD
|
| 1991 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1991 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1991 | A | conf |
SC
|
| 1991 | — | conf |
EURO-DAC
|
| 1991 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1991 | J | jnl |
Integr.
|
| 1989 | C | conf |
ICCD
|
| 1989 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1989 | A* | conf |
DAC
|
| 1989 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1989 | C | conf |
ICCD
|
| 1988 | A | conf |
ICCAD
|
| 1986 | — | conf |
Embedded Systems
|
| 1985 | J | jnl |
IEEE Des. Test
|
| 1985 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1982 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|