Wing Chiu Tam

13 papers A* 3A 3Misc 3Journal 4
YearRankTypeTitle / Venue / Authors
2014 J jnl
Design-for-Manufacturability Assessment for Integrated Circuits Using RADAR.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Wing Chiu Tam, R. D. (Shawn) Blanton
2012 J jnl
Physically-Aware Analysis of Systematic Defects in Integrated Circuits.
IEEE Des. Test Comput.
Wing Chiu Tam, Ronald D. Blanton
2012 J jnl
SLIDER: Simulation of Layout-Injected Defects for Electrical Responses.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Wing Chiu Tam, R. D. (Shawn) Blanton
2012 J jnl
Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations.
IEEE Des. Test Comput.
R. D. (Shawn) Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku
2011 A conf
Physically-aware analysis of systematic defects in integrated circuits.
ITC
Wing Chiu Tam, R. D. (Shawn) Blanton
2011 Misc conf
SLIDER: A fast and accurate defect simulation framework.
VTS
Wing Chiu Tam, Ronald D. Blanton
2011 A* conf
To DFM or not to DFM?
DAC
Wing Chiu Tam, R. D. (Shawn) Blanton
2010 A conf
Automatic classification of bridge defects.
ITC
Jeffrey E. Nelson, Wing Chiu Tam, Ronald D. Blanton
2010 Misc conf
Evaluating yield and testing impact of sub-wavelength lithography.
VTS
Wing Chiu Tam, R. D. (Shawn) Blanton, Wojciech Maly
2010 A conf
Systematic defect identification through layout snippet clustering.
ITC
Wing Chiu Tam, Osei Poku, Ronald D. Blanton
2009 A* conf
Automated failure population creation for validating integrated circuit diagnosis methods.
DAC
Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton
2009 Misc conf
Controlling DPPM through Volume Diagnosis.
VTS
Xiaochun Yu, Yen-Tzu Lin, Wing Chiu Tam, Osei Poku, Ronald D. Blanton
2008 A* conf
Precise failure localization using automated layout analysis of diagnosis candidates.
DAC
Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton