| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
ACM Trans. Softw. Eng. Methodol.
|
| 2025 | J | jnl |
Scalable and Precise Patch Robustness Certification for Deep Learning Models with Top-k Predictions.
CoRR
|
| 2024 | J | jnl |
ACM Trans. Inf. Syst.
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Proc. ACM Softw. Eng.
|
| 2024 | J | jnl |
Pattern Recognit.
|
| 2024 | B | conf |
ICMR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
CSEE&T
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
ACM Trans. Softw. Eng. Methodol.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
J. Syst. Softw.
|
| 2022 | J | jnl |
Pattern Recognit.
|