| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2018 | J | jnl |
Appl. Math. Comput.
|
| 2017 | A* | conf |
DAC
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2016 | A | conf |
ICCAD
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | A | conf |
DATE
|
| 2016 | A | conf |
DATE
|
| 2016 | A | conf |
DATE
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
ICICDT
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | A | conf |
ICCAD
|
| 2012 | A | conf |
DATE
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2001 | J | jnl |
VLSI Design
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 2001 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1993 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1990 | J | jnl |
Eur. Trans. Telecommun.
|