William V. Huott

17 papers A 9Journal 5Unranked 3
YearRankTypeTitle / Venue / Authors
2025 A conf
Ultra dense SRAM Cell Test Challenges.
ITC
Uma Srinivasan, William V. Huott, Austen Hall, Ryan Thorpe, Daniel Rodko, Greg Hornicek, Brian Noble
2019 — conf
Case Study of Advanced Diagnostic Techniques for Multi Port Register File.
NATW
Uma Srinivasan, William V. Huott, Chad Adams, Pete Freiburger, Franco Stellari, Peilin Song, Phong Tran, Dave Albert
2012 J jnl
Circuit and Physical Design Implementation of the Microprocessor Chip for the zEnterprise System.
IEEE J. Solid State Circuits
James D. Warnock, Yiu-Hing Chan, Sean M. Carey, Huajun Wen, Patrick J. Meaney, Guenter Gerwig, Howard H. Smith, Yuen H. Chan, John Davis, Paul Bunce, Antonio Pelella, Daniel Rodko, Pradip Patel, Thomas Strach, Doug Malone, Frank Malgioglio, José Neves, David L. Rude, William V. Huott
2011 — conf
A 5.2GHz microprocessor chip for the IBM zEnterprise™ system.
ISSCC
James D. Warnock, Y. Chan, William V. Huott, Sean M. Carey, Michael F. Fee, Huajun Wen, Mary Jo Saccamango, Frank Malgioglio, Patrick J. Meaney, Donald W. Plass, Yuen H. Chan, Mark D. Mayo, Guenter Mayer, Leon J. Sigal, David L. Rude, Robert M. Averill III, Michael H. Wood, Thomas Strach, Howard H. Smith, Brian W. Curran, Eric M. Schwarz, Lee Eisen, Doug Malone, Steve Weitzel, Pak-kin Mak, Thomas J. McPherson, Charles F. Webb
2010 A conf
Testing the IBM Power 7™ 4 GHz eight core microprocessor.
ITC
James Crafts, David Bogdan, Dennis Conti, Donato O. Forlenza, Orazio P. Forlenza, William V. Huott, Mary P. Kusko, Edward Seymour, Timothy Taylor, Brian Walsh
2008 A conf
On-chip Timing Uncertainty Measurements on IBM Microprocessors.
ITC
Robert L. Franch, Phillip J. Restle, James K. Norman, William V. Huott, Joshua Friedrich, R. Dixon, Steve Weitzel, K. van Goor, Gerard Salem
2007 A conf
On-chip timing uncertainty measurements on IBM microprocessors.
ITC
Robert L. Franch, Phillip J. Restle, James K. Norman, William V. Huott, Joshua Friedrich, R. Dixon, Steve Weitzel, K. van Goor, Gerard Salem
2006 — conf
A 5.6GHz 64kB Dual-Read Data Cache for the POWER6TM Processor.
ISSCC
John Davis, Don Plass, Paul Bunce, Yuen H. Chan, Antonio Pelella, Rajiv V. Joshi, A. Chen, William V. Huott, Thomas J. Knips, Pradip Patel, K. Lo, Eric Fluhr
2003 A conf
Diagnosis in Modern Design to Volume - The Tip of the Iceberg.
ITC
William V. Huott
2001 A conf
99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor.
ITC
Mary P. Kusko, Bryan J. Robbins, Timothy J. Koprowski, William V. Huott
1999 A conf
The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA).
ITC
William V. Huott, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Dennis Manzer, Pia N. Sanda, Steven C. Wilson, Yuen H. Chan, Antonio Pelella, Stanislav Polonsky
1998 A conf
Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip.
ITC
Mary P. Kusko, Bryan J. Robbins, Thomas J. Snethen, Peilin Song, Thomas G. Foote, William V. Huott
1998 J jnl
Testing the 500-MHz IBM S/390 Microprocessor.
IEEE Des. Test Comput.
Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins
1997 J jnl
A 4.1-ns compact 54×54-b multiplier utilizing sign-select Booth encoders.
IEEE J. Solid State Circuits
Charles F. Webb, Carl J. Anderson, Leon J. Sigal, Kenneth L. Shepard, John S. Liptay, James D. Warnock, Brian W. Curran, Barry Krumm, Mark D. Mayo, Peter J. Camporese, Eric M. Schwarz, Mark S. Farrell, Phillip J. Restle, Robert M. Averill III, Timothy J. Slegel, William V. Huott, Yuen H. Chan, Bruce Wile, Thao N. Nguyen, Philip G. Emma, Daniel K. Beece, Ching-Te Chuang, Cyril Price
1997 J jnl
Advanced microprocessor test strategy and methodology.
IBM J. Res. Dev.
William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko, Stephen Pateras, Dale E. Hoffman, Timothy G. McNamara, Thomas J. Snethen
1997 J jnl
Circuit design techniques for the high-performance CMOS IBM S/390 Parallel Enterprise Server G4 microprocessor.
IBM J. Res. Dev.
Leon J. Sigal, James D. Warnock, Brian W. Curran, Yuen H. Chan, Peter J. Camporese, Mark D. Mayo, William V. Huott, Daniel R. Knebel, Ching-Te Chuang, James P. Eckhardt, Philip T. Wu
1997 A conf
Testing the 400-MHz IBM Generation-4 CMOS Chip.
ITC
Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko