William Q. Meeker

46 papers Misc 2Journal 43Unranked 1

Year	Rank	Type	Title / Venue / Authors
2025	J	`jnl`	A Spatially Correlated Competing Risks Time-to-Event Model for Supercomputer GPU Failure Data. Technometrics Jie Min, Yili Hong, William Q. Meeker, George Ostrouchov
2025	J	`jnl`	Optimal Planning of Destructive Degradation Tests. Technometrics Jiaxiang Cai, William Q. Meeker, Zhi-Sheng Ye
2023	J	`jnl`	A Spatially Correlated Competing Risks Time-to-Event Model for Supercomputer GPU Failure Data. CoRR Jie Min, Yili Hong, William Q. Meeker, George Ostrouchov
2022	J	`jnl`	Prediction of Future Failures for Heterogeneous Reliability Field Data. Technometrics Colin Lewis-Beck, Qinglong Tian, William Q. Meeker
2021	J	`jnl`	Bayesian Methods for Planning Accelerated Repeated Measures Degradation Tests. Technometrics Brian P. Weaver, William Q. Meeker
2021	J	`jnl`	Quantitative Matching of Forensic Evidence Fragments Utilizing 3D Microscopy Analysis of Fracture Surface Replicas. CoRR Bishoy Dawood, Carlos Llosa-Vite, Geoffrey Z. Thompson, Barbara K. Lograsso, Lauren K. Claytor, John Vanderkolk, William Q. Meeker, Ranjan Maitra, Ashraf Bastawros
2021	J	`jnl`	Reliability Analysis of Artificial Intelligence Systems Using Recurrent Events Data from Autonomous Vehicles. CoRR Yili Hong, Jie Min, Caleb B. King, William Q. Meeker
2019	J	`jnl`	A Hierarchical Model for Heterogenous Reliability Field Data. Technometrics Eric Mittman, Colin Lewis-Beck, William Q. Meeker
2018	—	`conf`	Stochastic-Expansions-Based Model-Assisted Probability of Detection Analysis of the Spherically-Void-Defect Benchmark Problem. ICCS (2) Xiaosong Du, Praveen Gurrala, Leifur Leifsson, Jiming Song, William Q. Meeker, Ronald A. Roberts, Slawomir Koziel, Yonatan A. Tesfahunegn
2017	J	`jnl`	A Multi-Level Trend-Renewal Process for Modeling Systems With Recurrence Data. Technometrics Zhibing Xu, Yili Hong, William Q. Meeker, Brock E. Osborn, Kati Illouz
2017	J	`jnl`	A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images. Technometrics Ye Tian, Ranjan Maitra, William Q. Meeker, Stephen D. Holland
2017	J	`jnl`	Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes. Technometrics Wei Zhang, Ye Tian, Luis A. Escobar, William Q. Meeker
2017	J	`jnl`	Product Component Genealogy Modeling and Field-failure Prediction. Qual. Reliab. Eng. Int. Caleb B. King, Yili Hong, William Q. Meeker
2015	J	`jnl`	Assessing Risk of a Serious Failure Mode Based on Limited Field Data. IEEE Trans. Reliab. Zhibing Xu, Yili Hong, William Q. Meeker
2015	J	`jnl`	Statistical Methods for Degradation Data With Dynamic Covariates Information and an Application to Outdoor Weathering Data. Technometrics Yili Hong, Yuanyuan Duan, William Q. Meeker, Deborah L. Stanley, Xiaohong Gu
2015	J	`jnl`	Statistical Methods for Estimating the Minimum Thickness Along a Pipeline. Technometrics ShiYao Liu, William Q. Meeker
2014	J	`jnl`	Detecting cracks in aircraft engine fan blades using vibrothermography nondestructive evaluation. Reliab. Eng. Syst. Saf. Chunwang Gao, William Q. Meeker, Donna Mayton
2014	J	`jnl`	Physical Model-Assisted Probability of Detection of Flaws in Titanium Forgings Using Ultrasonic Nondestructive Evaluation. Technometrics Ming Li, William Q. Meeker, R. Bruce Thompson
2014	J	`jnl`	The Residual Lifetime of Surviving Components From Failed Coherent Systems. IEEE Trans. Reliab. Zhengcheng Zhang, William Q. Meeker
2013	J	`jnl`	Field-Failure Predictions Based on Failure-Time Data With Dynamic Covariate Information. Technometrics Yili Hong, William Q. Meeker
2013	J	`jnl`	Methods for Planning Repeated Measures Degradation Studies. Technometrics Brian P. Weaver, William Q. Meeker, Luis A. Escobar, Joanne Wendelberger
2012	J	`jnl`	Bayesian Methods for Accelerated Destructive Degradation Test Planning. IEEE Trans. Reliab. Ying Shi, William Q. Meeker
2011	J	`jnl`	Accelerated Destructive Degradation Tests Robust to Distribution Misspecification. IEEE Trans. Reliab. Shuen-Lin Jeng, Bei-Ying Huang, William Q. Meeker
2010	J	`jnl`	A Tool for Evaluating Time-Varying-Stress Accelerated Life Test Plans With Log-Location-Scale Distributions. IEEE Trans. Reliab. Yili Hong, Haiming Ma, William Q. Meeker
2010	J	`jnl`	Field-Failure and Warranty Prediction Based on Auxiliary Use-Rate Information. Technometrics Yili Hong, William Q. Meeker
2010	J	`jnl`	Strategy for Planning Accelerated Life Tests With Small Sample Sizes. IEEE Trans. Reliab. Haiming Ma, William Q. Meeker
2009	J	`jnl`	Accelerated Destructive Degradation Test Planning. Technometrics Ying Shi, Luis A. Escobar, William Q. Meeker
2009	J	`jnl`	Using Accelerated Life Tests Results to Predict Product Field Reliability. Technometrics William Q. Meeker, Luis A. Escobar, Yili Hong
2008	J	`jnl`	Analysis of Window-Observation Recurrence Data. Technometrics Jianying Zuo, William Q. Meeker, Huaiqing Wu
2008	J	`jnl`	Avoiding Problems With Normal Approximation Confidence Intervals for Probabilities. Technometrics Yili Hong, William Q. Meeker, Luis A. Escobar
2008	J	`jnl`	The Future of Industrial Statistics: A Panel Discussion. Technometrics David M. Steinberg, Søren Bisgaard, Necip Doganaksoy, Nicholas Fisher, Bert Gunter, Gerald J. Hahn, Sallie Keller-McNulty, Jon R. Kettenring, William Q. Meeker, Douglas C. Montgomery, C. F. Jeff Wu
2008	J	`jnl`	The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles. IEEE Trans. Reliab. Yili Hong, William Q. Meeker, Luis A. Escobar
2007	Misc	`conf`	Integrated Decision Algorithms for Auto-steered Electric Transmission System Asset Management. International Conference on Computational Science (1) James D. McCalley, Vasant G. Honavar, Sarah M. Ryan, William Q. Meeker, Daji Qiao, Ronald A. Roberts, Yuan Li, Jyotishman Pathak, Mujing Ye, Yili Hong
2006	Misc	`conf`	Auto-steered Information-Decision Processes for Electric System Asset Management. International Conference on Computational Science (3) James D. McCalley, Vasant G. Honavar, Sarah M. Ryan, William Q. Meeker, Ronald A. Roberts, Daji Qiao, Yuan Li
2006	J	`jnl`	Bayesian Methods for Planning Accelerated Life Tests. Technometrics Yao Zhang, William Q. Meeker
2005	J	`jnl`	Sample Size and Number of Failure Requirements for Demonstration Tests With Log-Location-Scale Distributions and Failure Censoring. Technometrics Scott W. McKane, Luis A. Escobar, William Q. Meeker
2004	J	`jnl`	Block Bootstrap Estimation of the Distribution of Cumulative Outdoor Degradation. Technometrics Victor Chan, Soumendra Nath Lahiri, William Q. Meeker
2004	J	`jnl`	Discussion. Technometrics William Q. Meeker, Luis A. Escobar
2003	J	`jnl`	Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications. Technometrics William Q. Meeker
2002	J	`jnl`	Early Detection of Reliability Problems Using Information From Warranty Databases. Technometrics Huaiqing Wu, William Q. Meeker
2002	J	`jnl`	Weibull Prediction Intervals for a Future Number of Failures. Technometrics Daniel J. Nordman, William Q. Meeker
2001	J	`jnl`	Parametric Simultaneous Confidence Bands for Cumulative Distributions From Censored Data. Technometrics Shuen-Lin Jeng, William Q. Meeker
2000	J	`jnl`	Comparisons of Approximate Confidence Interval Procedures for Type I Censored Data. Technometrics Shuen-Lin Jeng, William Q. Meeker
1999	J	`jnl`	Estimating Fatigue Curves With the Random Fatigue-Limit Model. Technometrics Francis G. Pascual, William Q. Meeker
1999	J	`jnl`	Statistical Prediction Based on Censored Life Data. Technometrics Luis A. Escobar, William Q. Meeker
1996	J	`jnl`	System Reliability Theory: Models and Statistics Methods (Arnljot Høyland and Marvin Rausand). SIAM Rev. William Q. Meeker