William J. Roesch

16 papers Journal 16
YearRankTypeTitle / Venue / Authors
2018 J jnl
Discovering and reducing defects in MIM capacitors.
Microelectron. Reliab.
William J. Roesch, Dorothy June M. Hamada
2015 J jnl
Setting stress conditions that qualify application expectations.
Microelectron. Reliab.
William J. Roesch
2014 J jnl
Separating HBT wearout from defects during early life operation.
Microelectron. Reliab.
William J. Roesch, Philip Rains
2012 J jnl
Introducing a scale structure to correlate quality and reliability.
Microelectron. Reliab.
William J. Roesch, Dorothy June M. Hamada, David Littleton
2012 J jnl
Using a new bathtub curve to correlate quality and reliability.
Microelectron. Reliab.
William J. Roesch
2011 J jnl
Drainage ratio impact on void creation in gold interconnect.
Microelectron. Reliab.
David Littleton, Dorothy June M. Hamada, William J. Roesch
2011 J jnl
The ROCS Workshop and 25 years of compound semiconductor reliability.
Microelectron. Reliab.
William J. Roesch
2008 J jnl
A wafer-level approach to device lifetesting.
Microelectron. Reliab.
Dorothy June M. Hamada, William J. Roesch
2008 J jnl
Forensic characterization of thin film resistor degradation.
Microelectron. Reliab.
William J. Roesch
2007 J jnl
Field returns, a source of natural failure mechanisms.
Microelectron. Reliab.
William J. Roesch, Steve Brockett
2006 J jnl
Compound semiconductor activation energy in humidity.
Microelectron. Reliab.
William J. Roesch
2006 J jnl
Historical review of compound semiconductor reliability.
Microelectron. Reliab.
William J. Roesch
2005 J jnl
Metal defect yield and reliability relationships.
Microelectron. Reliab.
William J. Roesch, Dorothy June M. Hamada
2004 J jnl
Cycling copper flip chip interconnects.
Microelectron. Reliab.
William J. Roesch, Suwanna Jittinorasett
2002 J jnl
Methods of reducing defects in GaAs ICs.
Microelectron. Reliab.
William J. Roesch
2001 J jnl
Volume impacts on GaAs reliability improvement.
Microelectron. Reliab.
William J. Roesch