William H. McAnney

18 papers A 11Journal 7

Year	Rank	Type	Title / Venue / Authors
1992	J	`jnl`	A Multiple Seed Linear Feedback Shift Register. IEEE Trans. Computers Jacob Savir, William H. McAnney
1991	J	`jnl`	Testing for Coupled Cells in Random-Access Memories. IEEE Trans. Computers Jacob Savir, William H. McAnney, Salvatore R. Vecchio
1990	A	`conf`	A multiple seed linear feedback shift register. ITC Jacob Savir, William H. McAnney
1989	A	`conf`	Testing for Coupled Cells in Random-Access Memories. ITC Jacob Savir, William H. McAnney, Salvatore R. Vecchio
1988	J	`jnl`	Built-In Checking of the Correct Self-Test Signature. IEEE Trans. Computers William H. McAnney, Jacob Savir
1988	J	`jnl`	Built-in test for RAMs. IEEE Des. Test Paul H. Bardell, William H. McAnney
1988	A	`conf`	Identification of Failing Tests with Cycling Registers. ITC Jacob Savir, William H. McAnney
1988	J	`jnl`	Random Pattern Testability of Delay Faults. IEEE Trans. Computers Jacob Savir, William H. McAnney
1987	J	`jnl`	Fault Propagation Through Embedded Multiport Memories. IEEE Trans. Computers Jacob Savir, William H. McAnney, Salvatore R. Vecchio
1986	A	`conf`	Built-In Checking of the Correct Self-Test Signature. ITC William H. McAnney, Jacob Savir
1986	J	`jnl`	Pseudorandom Arrays for Built-In Tests. IEEE Trans. Computers Paul H. Bardell, William H. McAnney
1986	A	`conf`	Random Pattern Testability of Delay Faults. ITC Jacob Savir, William H. McAnney
1985	A	`conf`	Random Pattern Testing for Address-Line Faults in an Embedded Multiport Memory. ITC Jacob Savir, William H. McAnney, Salvatore R. Vecchio
1985	A	`conf`	Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory. ITC Jacob Savir, William H. McAnney, Salvatore R. Vecchio
1985	A	`conf`	Self-Test of Random Access Memories. ITC Paul H. Bardell, William H. McAnney
1984	A	`conf`	Parallel Pseudorandom Sequences for Built-In Test. ITC Paul H. Bardell, William H. McAnney
1984	A	`conf`	Random Testing for Stuck-At Storage Cells in an Embedded Memory. ITC William H. McAnney, Paul H. Bardell, V. P. Gupta
1982	A	`conf`	Self-Testing of Multichip Logic Modules. ITC Paul H. Bardell, William H. McAnney