Willem D. van Driel

41 papers A 1C 5Journal 33Unranked 2
YearRankTypeTitle / Venue / Authors
2026 — conf
16.4 A One-Stage Bidirectional Rectifier with Pre-Charge-Based MPPT for Triboelectric Energy Harvesting with 93% MPPT Efficiency and 8.86× Power Enhancement.
ISSCC
Wenyu Peng, Jida Peng, Willem D. van Driel, GuoQi Zhang, Sijun Du
2025 J jnl
A Fully Integrated Electrostatic Charge Boosting Rectifier for Triboelectric Energy Harvesting.
IEEE J. Solid State Circuits
Wenyu Peng, Xinling Yue, Willem D. van Driel, GuoQi Zhang, Sijun Du
2025 J jnl
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices.
CoRR
Leo Guo, Adwait Inamdar, Willem D. van Driel, GuoQi Zhang
2025 J jnl
Long-Term Analysis of Temperature and Current-Dependent Degradation in Green High-Power Light-Emitting Diodes.
IEEE Access
Alexander Herzog, Matteo Buffolo, Francesco Piva, Simon Benkner, Babak Zandi, Jens Balasus, Paul Myland, Felix Wirth, Willem D. van Driel, Matteo Meneghini, Tran Quoc Khanh
2025 J jnl
Modeling Spectral LED Degradation Using an Unsupervised Machine Learning Approach.
IEEE Access
Alexander Herzog, Benoit Hamon, Paul Myland, Peter Förster, Simon Benkner, Babak Zandi, Victor Guerra, Sebastian Schöps, Willem D. van Driel, Tran Quoc Khanh
2024 — conf
A 70-V Fully Integrated Dual-SSHC Rectifier for Triboelectric Energy Harvesting with Full-Digital Duty-Cycle-Based MPPT Achieving 598% Power Extraction Enhancement.
CICC
Wenyu Peng, Xinling Yue, Willem D. van Driel, GuoQi Zhang, Sijun Du
2024 C conf
A MLOps Architecture for XAI in Industrial Applications.
ETFA
Leonhard Faubel, Thomas Woudsma, Leila Methnani, Amir Ghorbani Ghezeljhemeidan, Fabian Bülow, Klaus Schmid, Willem D. van Driel, Benjamin Klöpper, Andreas Theodorou, Mohsen Nosratinia, Magnus Bång
2024 A conf
AI-Enabled Board Level Vibration Testing: Unveiling The Physics of Degradation.
ITC
Varun Thukral, Chen He, Rebecca Chen, Letian Zhang, Romuald Roucou, Michiel van Soestbergen, Jeroen J. M. Zaal, Rene Rongen, Willem D. van Driel, G. Q. Zhang
2024 C conf
An Efficient Rectifier Hybridizing Synchronized Electric Charge Extraction and Bias-Flipping for Triboelectric Energy Harvesting.
ISCAS
Wenyu Peng, Willem D. van Driel, GuoQi Zhang, Sijun Du
2024 J jnl
LED Degradation Monitoring Using a Multi-Channel Spectral Sensor.
IEEE Access
Paul Myland, Alexander Herzog, Sebastian Babilon, Willem D. van Driel, Tran Quoc Khanh
2024 J jnl
Towards a digital twin architecture for the lighting industry.
Future Gener. Comput. Syst.
Victor Guerra, Benoit Hamon, Benoit Bataillou, Adwait Inamdar, Willem D. van Driel
2024 J jnl
Uncertainty analysis and interval prediction of LEDs lifetimes.
Reliab. Eng. Syst. Saf.
Roberto Rocchetta, Zhouzhao Zhan, Willem D. van Driel, Alessandro Di Bucchianico
2023 J jnl
Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes.
IEEE Access
Alexander Herzog, Simon Benkner, Babak Zandi, Matteo Buffolo, Willem D. van Driel, Matteo Meneghini, Tran Quoc Khanh
2023 J jnl
Towards an MLOps Architecture for XAI in Industrial Applications.
CoRR
Leonhard Faubel, Thomas Woudsma, Leila Methnani, Amir Ghorbani Ghezeljhemeidan, Fabian Bülow, Klaus Schmid, Willem D. van Driel, Benjamin Klöpper, Andreas Theodorou, Mohsen Nosratinia, Magnus Bång
2022 J jnl
Advancements in Spectral Power Distribution Modeling of Light-Emitting Diodes.
IEEE Access
Simon Benkner, Alexander Herzog, Stefan Klir, Willem D. van Driel, Tran Quoc Khanh
2022 C conf
Investigation of Potting Compounds on Thermal-Fatigue properties of Solder Interconnects.
IECON
Leiming Du, Xiujuan Zhao, Piet Watté, René Poelma, Willem D. van Driel, GuoQi Zhang
2021 C conf
The H2020-ECSEL Project "iRel40" (Intelligent Reliability 4.0).
DSD
Klaus Pressel, Josef Moser, Sven Rzepka, Klas Brinkfeldt, Susan Zhao, Willem D. van Driel, Paolo Giammatteo, Baris Bulut, Müjdat Soytürk, Luigi Pomante
2018 J jnl
A stochastic process based reliability prediction method for LED driver.
Reliab. Eng. Syst. Saf.
Bo Sun, Xuejun Fan, Willem D. van Driel, Chengqiang Cui, GuoQi Zhang
2017 J jnl
A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation.
Reliab. Eng. Syst. Saf.
Bo Sun, Xuejun Fan, Huaiyu Ye, Jiajie Fan, Cheng Qian, Willem D. van Driel, GuoQi Zhang
2015 C conf
DEWI - Wirelessly into the Future.
DSD
Werner Rom, Peter Priller, Jani Koivusaari, Maarjana Komi, Ramiro Robles, Luis Dominguez, Javier Rivilla, Willem D. van Driel
2014 J jnl
Accelerated life time testing and optical degradation of remote phosphor plates.
Microelectron. Reliab.
M. Yazdan Mehr, Willem D. van Driel, G. Q. Zhang
2014 J jnl
Reliability and optical properties of LED lens plates under high temperature stress.
Microelectron. Reliab.
M. Yazdan Mehr, Willem D. van Driel, Sau Koh, GuoQi Zhang
2012 J jnl
Diagnosing Lumen Depreciation in LED Lighting Systems: An Estimation Approach.
IEEE Trans. Signal Process.
Jianfei Dong, Ashish Pandharipande, Willem D. van Driel, GuoQi Zhang
2011 J jnl
Effect of high temperature aging on reliability of automotive electronics.
Microelectron. Reliab.
Dao-Guo Yang, F. F. Wan, Z. Y. Shou, Willem D. van Driel, H. Scholten, L. Goumans, Roberto Faria
2011 J jnl
Local stress analysis on semiconductor devices by combined experimental-numerical procedure.
Microelectron. Reliab.
Rene Kregting, Sander Gielen, Willem D. van Driel, Paul Alkemade, Hozan Miro, Jan-Dirk Kamminga
2010 J jnl
A fast moisture sensitivity level qualification method.
Microelectron. Reliab.
Xiaosong Ma, Kaspar M. B. Jansen, G. Q. Zhang, Willem D. van Driel, Olaf van der Sluis, Leo J. Ernst, C. Regards, Christian Gautier, Hélène Frémont
2010 J jnl
Challenges in the Assembly and Handling of Thin Film Capped MEMS Devices.
Sensors
Jeroen J. M. Zaal, Willem D. van Driel, G. Q. Zhang
2010 J jnl
Designing for reliability using a new Wafer Level Package structure.
Microelectron. Reliab.
Hendrik Pieter Hochstenbach, Willem D. van Driel, Dao-Guo Yang, Jeroen J. M. Zaal, E. Bagerman
2009 J jnl
Comparing drop impact test method using strain gauge measurements.
Microelectron. Reliab.
Y. Liu, F. J. H. G. Kessels, Willem D. van Driel, J. A. S. van Driel, F. L. Sun, G. Q. Zhang
2009 J jnl
Solder interconnect reliability under drop impact loading conditions using High-speed Cold Bump Pull.
Microelectron. Reliab.
Jeroen J. M. Zaal, Hendrik Pieter Hochstenbach, Willem D. van Driel, G. Q. Zhang
2009 J jnl
Solder-joint reliability of HVQFN-packages subjected to thermal cycling.
Microelectron. Reliab.
J. de Vries, M. Jansen, Willem D. van Driel
2008 J jnl
Characterization of semiconductor interfaces using a modified mixed mode bending apparatus.
Microelectron. Reliab.
J. Thijsse, Olaf van der Sluis, J. A. W. van Dommelen, Willem D. van Driel, Marc G. D. Geers
2008 J jnl
Fracture morphology and mechanism of IMC in Low-Ag SAC Solder/UBM (Ni(P)-Au) for WLCSP.
Microelectron. Reliab.
Fenglian Sun, Hendrik Pieter Hochstenbach, Willem D. van Driel, G. Q. (Kouchi) Zhang
2008 J jnl
The need for multi-scale approaches in Cu/low-k reliability issues.
Microelectron. Reliab.
Cadmus A. Yuan, Olaf van der Sluis, Willem D. van Driel, G. Q. (Kouchi) Zhang
2007 J jnl
Mechanical reliability challenges for MEMS packages: Capping.
Microelectron. Reliab.
Willem D. van Driel, Dao-Guo Yang, Cadmus A. Yuan, M. van Kleef, G. Q. (Kouchi) Zhang
2007 J jnl
Molecular simulation on the material/interfacial strength of the low-dielectric materials.
Microelectron. Reliab.
Cadmus A. Yuan, Olaf van der Sluis, G. Q. (Kouchi) Zhang, Leo J. Ernst, Willem D. van Driel, Richard B. R. van Silfhout
2006 J jnl
Delamination analysis of Cu/low-k technology subjected to chemical-mechanical polishing process conditions.
Microelectron. Reliab.
Cadmus A. Yuan, Willem D. van Driel, Richard B. R. van Silfhout, Olaf van der Sluis, Roy A. B. Engelen, Leo J. Ernst, Fred van Keulen, G. Q. Zhang
2004 J jnl
Characterization and Modelling of Moisture Driven Interface Failures.
Microelectron. Reliab.
Marcel A. J. van Gils, P. J. J. H. A. Habets, G. Q. Zhang, Willem D. van Driel, Piet J. G. Schreurs
2004 J jnl
Prediction of crack growth in IC passivation layers.
Microelectron. Reliab.
Y. T. He, Marcel A. J. van Gils, Willem D. van Driel, G. Q. Zhang, Richard B. R. van Silfhout, Leo J. Ernst
2004 J jnl
Prediction of interfacial delamination in stacked IC structures using combined experimental and simulation methods.
Microelectron. Reliab.
Willem D. van Driel, C. J. Liu, G. Q. Zhang, J. H. J. Janssen, Richard B. R. van Silfhout, Marcel A. J. van Gils, Leo J. Ernst
2004 J jnl
Prediction of thermo-mechanical integrity of wafer backend processes.
Microelectron. Reliab.
Viktor Gonda, Jaap M. J. den Toonder, Johan Beijer, G. Q. Zhang, Willem D. van Driel, Romano J. O. M. Hoofman, Leo J. Ernst