| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2026 | J | jnl |
Displays
|
| 2026 | J | jnl |
Cycle-CFM: An unsupervised framework for robust multimodal anomaly detection in industrial settings.
Expert Syst. Appl.
|
| 2026 | J | jnl |
J. Artif. Intell. Soft Comput. Res.
|
| 2026 | J | jnl |
CoRR
|
| 2025 | J | jnl |
J. Chem. Inf. Model.
|
| 2025 | J | jnl |
Digit. Signal Process.
|
| 2025 | J | jnl |
Digit. Signal Process.
|
| 2025 | J | jnl |
Displays
|
| 2025 | J | jnl |
Pattern Anal. Appl.
|
| 2025 | J | jnl |
Comput. Ind. Eng.
|
| 2025 | J | jnl |
Digit. Signal Process.
|
| 2025 | J | jnl |
Multim. Syst.
|
| 2025 | J | jnl |
Comput. Mater. Continua
|
| 2025 | J | jnl |
Digit. Signal Process.
|
| 2025 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Complex Intell. Syst.
|
| 2025 | J | jnl |
Digit. Signal Process.
|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | J | jnl |
Biomed. Signal Process. Control.
|
| 2025 | J | jnl |
Signal Image Video Process.
|
| 2025 | J | jnl |
Vis. Comput.
|
| 2024 | J | jnl |
Digit. Signal Process.
|
| 2024 | J | jnl |
Multim. Syst.
|
| 2024 | J | jnl |
Vis. Comput.
|
| 2024 | J | jnl |
J. Real Time Image Process.
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
Multim. Syst.
|
| 2024 | J | jnl |
Signal Image Video Process.
|
| 2024 | J | jnl |
Commun. Nonlinear Sci. Numer. Simul.
|
| 2024 | J | jnl |
Digit. Signal Process.
|
| 2023 | J | jnl |
Digit. Signal Process.
|
| 2023 | J | jnl |
Symmetry
|
| 2023 | J | jnl |
Digit. Signal Process.
|
| 2022 | J | jnl |
J. Comb. Optim.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
J. Electronic Imaging
|
| 2022 | J | jnl |
Image Vis. Comput.
|
| 2022 | J | jnl |
Theor. Comput. Sci.
|
| 2021 | — | conf |
NEMS
|
| 2021 | A* | conf |
WWW
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE Signal Process. Lett.
|
| 2021 | J | jnl |
J. Electronic Imaging
|
| 2021 | J | jnl |
CoRR
|
| 2021 | A* | conf |
IJCAI
|
| 2021 | J | jnl |
Multim. Tools Appl.
|
| 2020 | — | conf |
DASC/PiCom/CBDCom/CyberSciTech
|
| 2020 | J | jnl |
J. Comb. Optim.
|
| 2020 | J | jnl |
Int. J. Control
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2019 | J | jnl |
Signal Process.
|
| 2019 | J | jnl |
Future Internet
|
| 2019 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2018 | J | jnl |
Int. J. Syst. Sci.
|
| 2018 | J | jnl |
Signal Process.
|
| 2018 | J | jnl |
Digit. Signal Process.
|
| 2018 | J | jnl |
Digit. Signal Process.
|
| 2018 | J | jnl |
IET Image Process.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
Int. J. Emerg. Technol. Learn.
|
| 2017 | J | jnl |
Signal Process.
|
| 2017 | — | conf |
ICIRA (1)
|
| 2017 | J | jnl |
Sensors
|
| 2016 | — | conf |
ICIRA (2)
|
| 2016 | J | jnl |
Int. J. Found. Comput. Sci.
|
| 2016 | — | conf |
ICNC-FSKD
|
| 2016 | J | jnl |
Entropy
|
| 2016 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2015 | J | jnl |
J. Frankl. Inst.
|
| 2015 | J | jnl |
IEEE Signal Process. Lett.
|
| 2015 | J | jnl |
Theor. Comput. Sci.
|
| 2015 | J | jnl |
Sensors
|
| 2014 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2014 | J | jnl |
IEEE Trans. Signal Process.
|
| 2014 | J | jnl |
Commun. Stat. Simul. Comput.
|
| 2013 | J | jnl |
Int. J. Emerg. Technol. Learn.
|
| 2013 | J | jnl |
Int. J. Emerg. Technol. Learn.
|
| 2013 | J | jnl |
Sensors
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2012 | J | jnl |
J. Appl. Math.
|
| 2012 | J | jnl |
Comput. Oper. Res.
|
| 2012 | J | jnl |
J. Comb. Optim.
|
| 2012 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2011 | J | jnl |
Intell. Autom. Soft Comput.
|
| 2011 | — | conf |
EMEIT
|
| 2011 | — | conf |
Multi-objective optimization design of mining truck wheel reducer based on analysis of fatigue life.
EMEIT
|
| 2011 | J | jnl |
Inf. Process. Lett.
|
| 2011 | J | jnl |
Theor. Comput. Sci.
|
| 2011 | — | conf |
EMEIT
|
| 2011 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2009 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2009 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2009 | J | jnl |
Sensors
|
| 2009 | C | conf |
COCOA
|
| 2008 | — | conf |
CSSE (5)
|
| 2007 | J | jnl |
Sci. China Ser. F Inf. Sci.
|
| 2005 | J | jnl |
Microelectron. Reliab.
|