| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Microelectron. J.
|
| 2026 | J | jnl |
Commun. Nonlinear Sci. Numer. Simul.
|
| 2026 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2026 | J | jnl |
Math. Comput. Simul.
|
| 2026 | A* | conf |
AAAI
|
| 2026 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2026 | J | jnl |
Reliability estimation under cyclic accelerated life-testing based on scale family of distributions.
Comput. Ind. Eng.
|
| 2025 | J | jnl |
J. Comput. Phys.
|
| 2025 | J | jnl |
J. Comput. Phys.
|
| 2025 | J | jnl |
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2024 | J | jnl |
Trans. Inst. Meas. Control
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Int. J. Appl. Earth Obs. Geoinformation
|
| 2023 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
Signal Image Video Process.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
IEEE Access
|
| 2017 | — | conf |
MLICOM (1)
|
| 1998 | — | conf |
ICIP (3)
|