| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2019 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2017 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2017 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2017 | J | jnl |
Eur. J. Oper. Res.
|
| 2016 | J | jnl |
IEEE Trans. Reliab.
|
| 2015 | J | jnl |
IEEE Trans. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
IEEM
|
| 2015 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2015 | J | jnl |
J. Oper. Res. Soc.
|
| 2014 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2014 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2014 | J | jnl |
IEEE Trans. Reliab.
|
| 2014 | J | jnl |
Int. J. Inf. Syst. Chang. Manag.
|
| 2014 | J | jnl |
IEEE Trans. Reliab.
|
| 2013 | J | jnl |
Eur. J. Oper. Res.
|
| 2013 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2013 | J | jnl |
Eur. J. Oper. Res.
|
| 2012 | J | jnl |
IEEE Trans. Reliab.
|
| 2012 | J | jnl |
Expert Syst. Appl.
|
| 2012 | J | jnl |
IEEE Trans. Reliab.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2012 | J | jnl |
IEEE Trans. Reliab.
|
| 2011 | C | conf |
ISI
|
| 2011 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2011 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2011 | J | jnl |
Eur. J. Oper. Res.
|
| 2010 | J | jnl |
Reliab. Eng. Syst. Saf.
|