Wen Chen

17 papers A* 4A 3Misc 1Journal 4Unranked 4
YearRankTypeTitle / Venue / Authors
2021 Misc conf
Hybrid Methodology for Verification of SW Safety Mechanisms.
VTS
Sarvesh Patankar, Sainath Karlapalem, Sakshi Biyani, Wen Chen, Roman Chovanec, Martin Vlk, Martin Kaspar
2019 J jnl
Practices and Challenges for Achieving Functional Safety of Modern Automotive SoCs.
IEEE Des. Test
Wen Chen, Jayanta Bhadra
2018 A* conf
Protecting the supply chain for automotives and IoTs.
DAC
Sandip Ray, Wen Chen, Rosario Cammarota
2017 J jnl
Challenges and Trends in Modern SoC Design Verification.
IEEE Des. Test
Wen Chen, Sandip Ray, Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang
2017 J jnl
Data-Driven Test Plan Augmentation for Platform Verification.
IEEE Des. Test
Wen Chen, Kuo-Kai Hsieh, Li-Chung Wang, Jayanta Bhadra
2017 A* conf
Extensibility in Automotive Security: Current Practice and Challenges: Invited.
DAC
Sandip Ray, Wen Chen, Jayanta Bhadra, Mohammad Abdullah Al Faruque
2017 — conf
Feature extraction from design documents to enable rule learning for improving assertion coverage.
ASP-DAC
Kuo-Kai Hsieh, Sebastian Siatkowski, Li-C. Wang, Wen Chen, Jayanta Bhadra
2017 J jnl
Guest Editors' Introduction: Emerging Challenges and Solutions in SoC Verification.
IEEE Des. Test
Magdy S. Abadir, Jayanta Bhadra, Wen Chen, Li-C. Wang
2017 A* conf
Learning to Produce Direct Tests for Security Verification Using Constrained Process Discovery.
DAC
Kuo-Kai Hsieh, Li-C. Wang, Wen Chen, Jayanta Bhadra
2016 — conf
Striking a balance between SoC security and debug requirements.
SoCC
Wen Chen, Jayanta Bhadra
2014 — —
Data Learning Methodologies for Improving the Efficiency of Constrained Random Verification.
Wen Chen
2014 A conf
On application of data mining in functional debug.
ICCAD
Kuo-Kai Hsieh, Wen Chen, Li-C. Wang, Jayanta Bhadra
2013 — conf
Novel test analysis to improve structural coverage - A commercial experiment.
VLSI-DAT
Wen Chen, Li-C. Wang, Jayanta Bhadra, Magdy S. Abadir
2013 A* conf
Simulation knowledge extraction and reuse in constrained random processor verification.
DAC
Wen Chen, Li-C. Wang, Jay Bhadra, Magdy S. Abadir
2012 — conf
Data mining based prediction paradigm and its applications in design automation.
VLSI-DAT
Magdy S. Abadir, Nik Sumikawa, Wen Chen, Li-C. Wang
2012 A conf
Functional test content optimization for peak-power validation - An experimental study.
ITC
Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang
2012 A conf
Novel test detection to improve simulation efficiency - A commercial experiment.
ICCAD
Wen Chen, Nik Sumikawa, Li-C. Wang, Jayanta Bhadra, Xiushan Feng, Magdy S. Abadir