Wen-Kuan Yeh

11 papers Journal 10Unranked 1
YearRankTypeTitle / Venue / Authors
2020 — conf
Substrate Bias Effect on Dynamic Characteristics of a Monolithically Integrated GaN Half-Bridge.
IRPS
Wen Yang, Jiann-Shiun Yuan, Balakrishnan Krishnan, An-Jye Tzou, Wen-Kuan Yeh
2019 J jnl
Relationship of Channel and Surface Orientation to Mechanical and Electrical Stresses on N-Type FinFETs.
IEICE Trans. Electron.
Wen-Teng Chang, Shih-Wei Lin, Min-Cheng Chen, Wen-Kuan Yeh
2016 J jnl
Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs.
Microelectron. Reliab.
Wenqi Zhang, Tzuo-Li Wang, Yan-hua Huang, Tsu-Ting Cheng, Shih-Yao Chen, Yiying Li, Chun-Hsiang Hsu, Chih-Jui Lai, Wen-Kuan Yeh, Yilin Yang
2014 J jnl
Reliability of the doping concentration in an ultra-thin body and buried oxide silicon on insulator (SOI) and comparison with a partially depleted SOI.
Microelectron. Reliab.
Wen-Teng Chang, Chun-Ming Lai, Wen-Kuan Yeh
2014 J jnl
Using Capacitance Sensor to Extract Characteristic Signals of Dozing from Skin Surface.
J. Sensors
Po-Ying Chen, Chi-Chang Chen, Wen-Kuan Yeh, Yukan Chang, Der-Chen Huang, Shyr-Shen Yu, Chwei-Shyong Tsai, Yu-Jung Huang, Wei-Cheng Lin, Shao-I Chu, Chung-Long Pan, Tsung-Hung Lin, Shyh-Chang Liu
2013 J jnl
The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET.
Microelectron. Reliab.
Wen-Kuan Yeh, Po-Ying Chen, Kwang-Jow Gan, Jer-Chyi Wang, Chao-Sung Lai
2011 J jnl
NBTI reliability on high-k metal-gate SiGe transistor and circuit performances.
Microelectron. Reliab.
Jiann-Shiun Yuan, Wen-Kuan Yeh, Shuyu Chen, Chia-Wei Hsu
2010 J jnl
Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances.
Microelectron. Reliab.
Jiann-Shiun Yuan, J. Ma, Wen-Kuan Yeh, Chia-Wei Hsu
2010 J jnl
Improvement of TDDB reliability, characteristics of HfO
Microelectron. Reliab.
Chia-Wei Hsu, Yean-Kuen Fang, Wen-Kuan Yeh, Chun-Yu Chen, Yen-Ting Chiang, Feng-Renn Juang, Chien-Ting Lin, Chieh-Ming Lai
2008 J jnl
Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer.
Microelectron. Reliab.
Chia-Wei Hsu, Yean-Kuen Fang, Wen-Kuan Yeh, Chien-Ting Lin
2007 J jnl
The impacts of high tensile stress CESL and geometry design on device performance and reliability for 90 nm SOI nMOSFETs.
Microelectron. Reliab.
Chieh-Ming Lai, Yean-Kuen Fang, Chien-Ting Lin, Chia-Wei Hsu, Wen-Kuan Yeh